Unseen-Material Few-Shot Defect Segmentation With Optimal Bilateral Feature Transport Network

Dexing Shan, Yunzhou Zhang, Sonya A. Coleman, Dermot Kerr, Shitong Liu, Ziqiang Hu

Research output: Contribution to journalArticlepeer-review

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Abstract

Industrial defect segmentation is important to ensure product quality and production safety. The main challenges in industrial applications are insufficient defect samples, large intra-class variation, and the interference of background information. However, most current texture defect segmentation methods rely on large-scale datasets and can only deal with one specific type of texture defect, which reduces the application efficiency and application scope of defect segmentation algorithms. To this end, we propose an optimal bilateral feature transport network (OBFTNet) for few-shot texture defect segmentation, which can accurately segment texture defects in multiple unseen materials (domains), such as steel, wood, leather, etc. OBFTNet can perform bilateral prediction for background and defect regions of unseen material by dynamically predicting task-specific semantic correspondences conditioned on a small guidance set. Specifically, we introduce background images (defect-free images) as supplementary learning information for reverse prediction and model the semantic correspondence between the guidance (support and background images) and the query images in few-shot segmentation as an optimal bilateral feature transport problem and generate a set of optimal bilateral correlation tensors. Using 4D and 2D convolutions the model gradually reduces optimal bilateral correlation tensors to precise segmentation masks. Experimental results show that our proposed method outperforms several state-of-the-art techniques with very few labeled samples and the method generalizes well to industrial defects on unseen materials.
Original languageEnglish
Pages (from-to)1-11
Number of pages11
JournalIEEE Transactions on Industrial Informatics
DOIs
Publication statusPublished (in print/issue) - 25 Oct 2022

Keywords

  • Electrical and Electronic Engineering
  • Computer Science Applications
  • Information Systems
  • Control and Systems Engineering

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