Thickness dependence of domain period in BafoxTiyFe12_x_yO 9

J Simsova, R Gemperle, R Kambersky, M Cernansky, R Gerber, P Papakonstantinou, R Atkinson

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

The thickness dependence of the domain period in pure and Co/Ti doped BaM hexaferrite polycrystalline films and wedge form single crystal platelets is studied by the colloid-SEM (scanning electron microscope) method. Experimental data on equilibrium domain periods are compared with the theoretical ones. Theoretical extrapolation allows to estimate the 'critical' film thickness below which the eqnilibriam domain period increases for various compositions.
LanguageEnglish
Pages247-248
JournalJournal of Magnetism and Magnetic Materials
Volume148
DOIs
Publication statusPublished - 1 Jul 1995

Fingerprint

Colloids
Platelets
Extrapolation
Film thickness
Electron microscopes
Single crystals
Scanning
Scanning electron microscopy
Chemical analysis
platelets
wedges
colloids
extrapolation
film thickness
electron microscopes
scanning electron microscopy
scanning
single crystals
estimates

Cite this

Simsova, J., Gemperle, R., Kambersky, R., Cernansky, M., Gerber, R., Papakonstantinou, P., & Atkinson, R. (1995). Thickness dependence of domain period in BafoxTiyFe12_x_yO 9. 148, 247-248. https://doi.org/10.1016/0304-8853(95)00224-3
Simsova, J ; Gemperle, R ; Kambersky, R ; Cernansky, M ; Gerber, R ; Papakonstantinou, P ; Atkinson, R. / Thickness dependence of domain period in BafoxTiyFe12_x_yO 9. 1995 ; Vol. 148. pp. 247-248.
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Simsova, J, Gemperle, R, Kambersky, R, Cernansky, M, Gerber, R, Papakonstantinou, P & Atkinson, R 1995, 'Thickness dependence of domain period in BafoxTiyFe12_x_yO 9', vol. 148, pp. 247-248. https://doi.org/10.1016/0304-8853(95)00224-3

Thickness dependence of domain period in BafoxTiyFe12_x_yO 9. / Simsova, J; Gemperle, R; Kambersky, R; Cernansky, M; Gerber, R; Papakonstantinou, P; Atkinson, R.

Vol. 148, 01.07.1995, p. 247-248.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Thickness dependence of domain period in BafoxTiyFe12_x_yO 9

AU - Simsova, J

AU - Gemperle, R

AU - Kambersky, R

AU - Cernansky, M

AU - Gerber, R

AU - Papakonstantinou, P

AU - Atkinson, R

PY - 1995/7/1

Y1 - 1995/7/1

N2 - The thickness dependence of the domain period in pure and Co/Ti doped BaM hexaferrite polycrystalline films and wedge form single crystal platelets is studied by the colloid-SEM (scanning electron microscope) method. Experimental data on equilibrium domain periods are compared with the theoretical ones. Theoretical extrapolation allows to estimate the 'critical' film thickness below which the eqnilibriam domain period increases for various compositions.

AB - The thickness dependence of the domain period in pure and Co/Ti doped BaM hexaferrite polycrystalline films and wedge form single crystal platelets is studied by the colloid-SEM (scanning electron microscope) method. Experimental data on equilibrium domain periods are compared with the theoretical ones. Theoretical extrapolation allows to estimate the 'critical' film thickness below which the eqnilibriam domain period increases for various compositions.

U2 - 10.1016/0304-8853(95)00224-3

DO - 10.1016/0304-8853(95)00224-3

M3 - Article

VL - 148

SP - 247

EP - 248

ER -

Simsova J, Gemperle R, Kambersky R, Cernansky M, Gerber R, Papakonstantinou P et al. Thickness dependence of domain period in BafoxTiyFe12_x_yO 9. 1995 Jul 1;148:247-248. https://doi.org/10.1016/0304-8853(95)00224-3