Thickness dependence of domain period in BafoxTiyFe12_x_yO 9

J Simsova; R Gemperle; R Kambersky; M Cernansky; R Gerber; P Papakonstantinou; R Atkinson

doi:10.1016/0304-8853(95)00224-3

Thickness dependence of domain period in BafoxTiyFe12_x_yO 9

J Simsova, R Gemperle, R Kambersky, M Cernansky, R Gerber, P Papakonstantinou, R Atkinson

Faculty Of Computing, Eng. & Built Env.

Research output: Contribution to journal › Article › peer-review

2 Citations (Scopus)

Abstract

The thickness dependence of the domain period in pure and Co/Ti doped BaM hexaferrite polycrystalline films and wedge form single crystal platelets is studied by the colloid-SEM (scanning electron microscope) method. Experimental data on equilibrium domain periods are compared with the theoretical ones. Theoretical extrapolation allows to estimate the 'critical' film thickness below which the eqnilibriam domain period increases for various compositions.

Original language	English
Pages (from-to)	247-248
Journal	Journal of Magnetism and Magnetic Materials
Volume	148
DOIs	https://doi.org/10.1016/0304-8853(95)00224-3
Publication status	Published (in print/issue) - 1 Jul 1995

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10.1016/0304-8853(95)00224-3

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title = "Thickness dependence of domain period in BafoxTiyFe12_x_yO 9",

abstract = "The thickness dependence of the domain period in pure and Co/Ti doped BaM hexaferrite polycrystalline films and wedge form single crystal platelets is studied by the colloid-SEM (scanning electron microscope) method. Experimental data on equilibrium domain periods are compared with the theoretical ones. Theoretical extrapolation allows to estimate the 'critical' film thickness below which the eqnilibriam domain period increases for various compositions.",

author = "J Simsova and R Gemperle and R Kambersky and M Cernansky and R Gerber and P Papakonstantinou and R Atkinson",

year = "1995",

month = jul,

day = "1",

doi = "10.1016/0304-8853(95)00224-3",

language = "English",

volume = "148",

pages = "247--248",

journal = "Journal of Magnetism and Magnetic Materials",

publisher = "Elsevier",

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TY - JOUR

T1 - Thickness dependence of domain period in BafoxTiyFe12_x_yO 9

AU - Simsova, J

AU - Gemperle, R

AU - Kambersky, R

AU - Cernansky, M

AU - Gerber, R

AU - Papakonstantinou, P

AU - Atkinson, R

PY - 1995/7/1

Y1 - 1995/7/1

N2 - The thickness dependence of the domain period in pure and Co/Ti doped BaM hexaferrite polycrystalline films and wedge form single crystal platelets is studied by the colloid-SEM (scanning electron microscope) method. Experimental data on equilibrium domain periods are compared with the theoretical ones. Theoretical extrapolation allows to estimate the 'critical' film thickness below which the eqnilibriam domain period increases for various compositions.

AB - The thickness dependence of the domain period in pure and Co/Ti doped BaM hexaferrite polycrystalline films and wedge form single crystal platelets is studied by the colloid-SEM (scanning electron microscope) method. Experimental data on equilibrium domain periods are compared with the theoretical ones. Theoretical extrapolation allows to estimate the 'critical' film thickness below which the eqnilibriam domain period increases for various compositions.

U2 - 10.1016/0304-8853(95)00224-3

DO - 10.1016/0304-8853(95)00224-3

M3 - Article

VL - 148

SP - 247

EP - 248

JO - Journal of Magnetism and Magnetic Materials

JF - Journal of Magnetism and Magnetic Materials

ER -

Thickness dependence of domain period in BafoxTiyFe12_x_yO 9

Abstract

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