Thickness dependence of domain period in BafoxTiyFe12_x_yO 9

J Simsova, R Gemperle, R Kambersky, M Cernansky, R Gerber, P Papakonstantinou, R Atkinson

Research output: Contribution to journalArticle

2 Citations (Scopus)

Abstract

The thickness dependence of the domain period in pure and Co/Ti doped BaM hexaferrite polycrystalline films and wedge form single crystal platelets is studied by the colloid-SEM (scanning electron microscope) method. Experimental data on equilibrium domain periods are compared with the theoretical ones. Theoretical extrapolation allows to estimate the 'critical' film thickness below which the eqnilibriam domain period increases for various compositions.
Original languageEnglish
Pages (from-to)247-248
JournalJournal of Magnetism and Magnetic Materials
Volume148
DOIs
Publication statusPublished - 1 Jul 1995

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