Super-Resolution Defect Characterization Using Microwave Near-Field Resonance Reflectometry and Cross-correlation Image Processing

Oleksandr Malyuskin, Vincent Fusco

Research output: Contribution to journalArticle

3 Citations (Scopus)

Abstract

A super-resolution defect characterization technique based on near-field resonance reflectometry and cross-correlation image processing is proposed in this paper. The hardware part of the microwave imaging system employs a novel loaded aperture (LA) probe which allows collimation of the electromagnetic field to approximately λ/10 focal spot(s) at λ/100 to λ/10 stand-off distances, λ being the wavelength of radiation in free space. The characteristic raw image spatial resolution of the LA probe is around λ/10 in one dimension with amplitude contrast/sensitivity exceeding 10–20 dB. It is demonstrated that the LA spatial resolution can be at least two times enhanced in two dimensions in the image plane using basic cross-correlation image processing while retaining a very high level of amplitude contrast of at least 10 dB.
LanguageEnglish
JournalSensing and Imaging
Volume18
Early online date21 Jan 2017
DOIs
Publication statusE-pub ahead of print - 21 Jan 2017

Fingerprint

cross correlation
image processing
near fields
apertures
microwaves
defects
spatial resolution
probes
image resolution
collimation
retaining
hardware
electromagnetic fields
sensitivity
radiation
wavelengths

Keywords

  • Near-field reflectometryMicrowave high-resolution imagingApertureElectromagnetic field enhancementMeasurementImageCorrelation

Cite this

@article{785448730a3b4cd89585ee141dc3fcff,
title = "Super-Resolution Defect Characterization Using Microwave Near-Field Resonance Reflectometry and Cross-correlation Image Processing",
abstract = "A super-resolution defect characterization technique based on near-field resonance reflectometry and cross-correlation image processing is proposed in this paper. The hardware part of the microwave imaging system employs a novel loaded aperture (LA) probe which allows collimation of the electromagnetic field to approximately λ/10 focal spot(s) at λ/100 to λ/10 stand-off distances, λ being the wavelength of radiation in free space. The characteristic raw image spatial resolution of the LA probe is around λ/10 in one dimension with amplitude contrast/sensitivity exceeding 10–20 dB. It is demonstrated that the LA spatial resolution can be at least two times enhanced in two dimensions in the image plane using basic cross-correlation image processing while retaining a very high level of amplitude contrast of at least 10 dB.",
keywords = "Near-field reflectometryMicrowave high-resolution imagingApertureElectromagnetic field enhancementMeasurementImageCorrelation",
author = "Oleksandr Malyuskin and Vincent Fusco",
year = "2017",
month = "1",
day = "21",
doi = "10.1007/s11220-017-0157-8",
language = "English",
volume = "18",
journal = "Sensing and Imaging",
issn = "1557-2064",

}

Super-Resolution Defect Characterization Using Microwave Near-Field Resonance Reflectometry and Cross-correlation Image Processing. / Malyuskin, Oleksandr; Fusco, Vincent.

In: Sensing and Imaging, Vol. 18, 21.01.2017.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Super-Resolution Defect Characterization Using Microwave Near-Field Resonance Reflectometry and Cross-correlation Image Processing

AU - Malyuskin, Oleksandr

AU - Fusco, Vincent

PY - 2017/1/21

Y1 - 2017/1/21

N2 - A super-resolution defect characterization technique based on near-field resonance reflectometry and cross-correlation image processing is proposed in this paper. The hardware part of the microwave imaging system employs a novel loaded aperture (LA) probe which allows collimation of the electromagnetic field to approximately λ/10 focal spot(s) at λ/100 to λ/10 stand-off distances, λ being the wavelength of radiation in free space. The characteristic raw image spatial resolution of the LA probe is around λ/10 in one dimension with amplitude contrast/sensitivity exceeding 10–20 dB. It is demonstrated that the LA spatial resolution can be at least two times enhanced in two dimensions in the image plane using basic cross-correlation image processing while retaining a very high level of amplitude contrast of at least 10 dB.

AB - A super-resolution defect characterization technique based on near-field resonance reflectometry and cross-correlation image processing is proposed in this paper. The hardware part of the microwave imaging system employs a novel loaded aperture (LA) probe which allows collimation of the electromagnetic field to approximately λ/10 focal spot(s) at λ/100 to λ/10 stand-off distances, λ being the wavelength of radiation in free space. The characteristic raw image spatial resolution of the LA probe is around λ/10 in one dimension with amplitude contrast/sensitivity exceeding 10–20 dB. It is demonstrated that the LA spatial resolution can be at least two times enhanced in two dimensions in the image plane using basic cross-correlation image processing while retaining a very high level of amplitude contrast of at least 10 dB.

KW - Near-field reflectometryMicrowave high-resolution imagingApertureElectromagnetic field enhancementMeasurementImageCorrelation

U2 - 10.1007/s11220-017-0157-8

DO - 10.1007/s11220-017-0157-8

M3 - Article

VL - 18

JO - Sensing and Imaging

T2 - Sensing and Imaging

JF - Sensing and Imaging

SN - 1557-2064

ER -