Sub-nanometer resolution imaging with amplitude-modulation atomic force microscopy in liquid

Ethan J Miller, W Trewby, Amir Farokh Payam, Luca Piantanida, Clodomiro Cafolla, Kislon Voitchovsky

Research output: Contribution to journalArticle

15 Citations (Scopus)

Abstract

Atomic force microscopy (AFM) has become a well-established technique for nanoscale imaging of samples in air and in liquid. Recent studies have shown that when operated in amplitude-modulation (tapping) mode, atomic or molecular-level resolution images can be achieved over a wide range of soft and hard samples in liquid. In these situations, small oscillation amplitudes (SAM-AFM) enhance the resolution by exploiting the solvated liquid at the surface of the sample. Although the technique has been successfully applied across fields as diverse as materials science, biology and biophysics and surface chemistry, obtaining high-resolution images in liquid can still remain challenging for novice users. This is partly due to the large number of variables to control and optimize such as the choice of cantilever, the sample preparation, and the correct manipulation of the imaging parameters. Here, we present a protocol for achieving high-resolution images of hard and soft samples in fluid using SAM-AFM on a commercial instrument. Our goal is to provide a step-by-step practical guide to achieving high-resolution images, including the cleaning and preparation of the apparatus and the sample, the choice of cantilever and optimization of the imaging parameters. For each step, we explain the scientific rationale behind our choices to facilitate the adaptation of the methodology to every user's specific system.
LanguageEnglish
JournalJournal of Visualized Experiments
Issue number118
DOIs
Publication statusPublished - 20 Dec 2016

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atomic force microscopy
liquids
high resolution
biophysics
preparation
image resolution
materials science
biology
cleaning
manipulators
methodology
chemistry
oscillations
optimization
fluids
air

Cite this

J Miller, Ethan ; Trewby, W ; Farokh Payam, Amir ; Piantanida, Luca ; Cafolla, Clodomiro ; Voitchovsky, Kislon. / Sub-nanometer resolution imaging with amplitude-modulation atomic force microscopy in liquid. In: Journal of Visualized Experiments. 2016 ; No. 118.
@article{b2fde0a5620446b5b53f4a18afc77de9,
title = "Sub-nanometer resolution imaging with amplitude-modulation atomic force microscopy in liquid",
abstract = "Atomic force microscopy (AFM) has become a well-established technique for nanoscale imaging of samples in air and in liquid. Recent studies have shown that when operated in amplitude-modulation (tapping) mode, atomic or molecular-level resolution images can be achieved over a wide range of soft and hard samples in liquid. In these situations, small oscillation amplitudes (SAM-AFM) enhance the resolution by exploiting the solvated liquid at the surface of the sample. Although the technique has been successfully applied across fields as diverse as materials science, biology and biophysics and surface chemistry, obtaining high-resolution images in liquid can still remain challenging for novice users. This is partly due to the large number of variables to control and optimize such as the choice of cantilever, the sample preparation, and the correct manipulation of the imaging parameters. Here, we present a protocol for achieving high-resolution images of hard and soft samples in fluid using SAM-AFM on a commercial instrument. Our goal is to provide a step-by-step practical guide to achieving high-resolution images, including the cleaning and preparation of the apparatus and the sample, the choice of cantilever and optimization of the imaging parameters. For each step, we explain the scientific rationale behind our choices to facilitate the adaptation of the methodology to every user's specific system.",
author = "{J Miller}, Ethan and W Trewby and {Farokh Payam}, Amir and Luca Piantanida and Clodomiro Cafolla and Kislon Voitchovsky",
year = "2016",
month = "12",
day = "20",
doi = "10.3791/54924",
language = "English",
journal = "Journal of Visualized Experiments",
issn = "1940-087X",
publisher = "MYJoVE Corporation",
number = "118",

}

Sub-nanometer resolution imaging with amplitude-modulation atomic force microscopy in liquid. / J Miller, Ethan; Trewby, W; Farokh Payam, Amir; Piantanida, Luca; Cafolla, Clodomiro; Voitchovsky, Kislon.

In: Journal of Visualized Experiments, No. 118, 20.12.2016.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Sub-nanometer resolution imaging with amplitude-modulation atomic force microscopy in liquid

AU - J Miller, Ethan

AU - Trewby, W

AU - Farokh Payam, Amir

AU - Piantanida, Luca

AU - Cafolla, Clodomiro

AU - Voitchovsky, Kislon

PY - 2016/12/20

Y1 - 2016/12/20

N2 - Atomic force microscopy (AFM) has become a well-established technique for nanoscale imaging of samples in air and in liquid. Recent studies have shown that when operated in amplitude-modulation (tapping) mode, atomic or molecular-level resolution images can be achieved over a wide range of soft and hard samples in liquid. In these situations, small oscillation amplitudes (SAM-AFM) enhance the resolution by exploiting the solvated liquid at the surface of the sample. Although the technique has been successfully applied across fields as diverse as materials science, biology and biophysics and surface chemistry, obtaining high-resolution images in liquid can still remain challenging for novice users. This is partly due to the large number of variables to control and optimize such as the choice of cantilever, the sample preparation, and the correct manipulation of the imaging parameters. Here, we present a protocol for achieving high-resolution images of hard and soft samples in fluid using SAM-AFM on a commercial instrument. Our goal is to provide a step-by-step practical guide to achieving high-resolution images, including the cleaning and preparation of the apparatus and the sample, the choice of cantilever and optimization of the imaging parameters. For each step, we explain the scientific rationale behind our choices to facilitate the adaptation of the methodology to every user's specific system.

AB - Atomic force microscopy (AFM) has become a well-established technique for nanoscale imaging of samples in air and in liquid. Recent studies have shown that when operated in amplitude-modulation (tapping) mode, atomic or molecular-level resolution images can be achieved over a wide range of soft and hard samples in liquid. In these situations, small oscillation amplitudes (SAM-AFM) enhance the resolution by exploiting the solvated liquid at the surface of the sample. Although the technique has been successfully applied across fields as diverse as materials science, biology and biophysics and surface chemistry, obtaining high-resolution images in liquid can still remain challenging for novice users. This is partly due to the large number of variables to control and optimize such as the choice of cantilever, the sample preparation, and the correct manipulation of the imaging parameters. Here, we present a protocol for achieving high-resolution images of hard and soft samples in fluid using SAM-AFM on a commercial instrument. Our goal is to provide a step-by-step practical guide to achieving high-resolution images, including the cleaning and preparation of the apparatus and the sample, the choice of cantilever and optimization of the imaging parameters. For each step, we explain the scientific rationale behind our choices to facilitate the adaptation of the methodology to every user's specific system.

U2 - 10.3791/54924

DO - 10.3791/54924

M3 - Article

JO - Journal of Visualized Experiments

T2 - Journal of Visualized Experiments

JF - Journal of Visualized Experiments

SN - 1940-087X

IS - 118

ER -