Structural and surface energy analysis of nitrogenated ta-C films

Md. A Rahman, Navneet Soin, PD Maguire, R D'Sa, SS Roy, CMO Mahony, P Lemoine, R McCann, SK Mitra, JAD McLaughlin

Research output: Contribution to journalArticle

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Abstract

Surface and bulk properties of the Filtered Cathodic Vacuum Arc prepared nitrogenated tetrahedral amorphous carbon (ta-C:N) films were characterized by X-ray Photoelectron Spectroscopy (XPS), Time of Flight Secondary Ion Mass Spectroscopy (ToF-SIMS), Raman spectroscopy, Atomic Force microscopy and contact angle techniques. An increase in the Nitrogen (N) content of the films is accompanied by a reduction in the sp3 fraction, confirmed via the deconvolution of the C 1 s XPS spectra. Critical Raman parameters such as peak position and peak width of the G band, defect ratio, ID/IG and skewness of the G line were analyzed as a function of N content. ToF-SIMS showed the variance of chemical composition with the increase in the sputtering depth. While some amount of incorporated oxygen and hydrogen were observed for all films; for high N content ta-C:N films signature of CN bonds was evident. Surface energies (both polar and dispersive components) for these ta-C:N films were analyzed in a geometric mean approach. Contact angle measurements using both deionized water and ethylene glycol reveal that upon the insertion of nitrogen into ta-C films, the initial change in the contact angle is sharp, followed by a gradual decrease with subsequent increase in N content. The variation of contact angle with increasing N content corresponds to an increase of the total surface energy with an increase of the polar component and a decrease of the dispersive component.
LanguageEnglish
Pages294-301
JournalThin Solid Films
Volume520
Issue number1
DOIs
Publication statusPublished - 2011

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Interfacial energy
surface energy
Contact angle
Carbon films
Amorphous carbon
Amorphous films
Nitrogen
X ray photoelectron spectroscopy
Spectroscopy
Ions
Ethylene Glycol
energy
Deionized water
carbon
Deconvolution
mass spectroscopy
Angle measurement
Ethylene glycol
photoelectron spectroscopy
Sputtering

Cite this

Rahman, Md. A ; Soin, Navneet ; Maguire, PD ; D'Sa, R ; Roy, SS ; Mahony, CMO ; Lemoine, P ; McCann, R ; Mitra, SK ; McLaughlin, JAD. / Structural and surface energy analysis of nitrogenated ta-C films. In: Thin Solid Films. 2011 ; Vol. 520, No. 1. pp. 294-301.
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Structural and surface energy analysis of nitrogenated ta-C films. / Rahman, Md. A; Soin, Navneet; Maguire, PD; D'Sa, R; Roy, SS; Mahony, CMO; Lemoine, P; McCann, R; Mitra, SK; McLaughlin, JAD.

In: Thin Solid Films, Vol. 520, No. 1, 2011, p. 294-301.

Research output: Contribution to journalArticle

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AU - Rahman, Md. A

AU - Soin, Navneet

AU - Maguire, PD

AU - D'Sa, R

AU - Roy, SS

AU - Mahony, CMO

AU - Lemoine, P

AU - McCann, R

AU - Mitra, SK

AU - McLaughlin, JAD

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AB - Surface and bulk properties of the Filtered Cathodic Vacuum Arc prepared nitrogenated tetrahedral amorphous carbon (ta-C:N) films were characterized by X-ray Photoelectron Spectroscopy (XPS), Time of Flight Secondary Ion Mass Spectroscopy (ToF-SIMS), Raman spectroscopy, Atomic Force microscopy and contact angle techniques. An increase in the Nitrogen (N) content of the films is accompanied by a reduction in the sp3 fraction, confirmed via the deconvolution of the C 1 s XPS spectra. Critical Raman parameters such as peak position and peak width of the G band, defect ratio, ID/IG and skewness of the G line were analyzed as a function of N content. ToF-SIMS showed the variance of chemical composition with the increase in the sputtering depth. While some amount of incorporated oxygen and hydrogen were observed for all films; for high N content ta-C:N films signature of CN bonds was evident. Surface energies (both polar and dispersive components) for these ta-C:N films were analyzed in a geometric mean approach. Contact angle measurements using both deionized water and ethylene glycol reveal that upon the insertion of nitrogen into ta-C films, the initial change in the contact angle is sharp, followed by a gradual decrease with subsequent increase in N content. The variation of contact angle with increasing N content corresponds to an increase of the total surface energy with an increase of the polar component and a decrease of the dispersive component.

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