Rheological analysis of creep in hydrogenated amorphous carbon films

Research output: Contribution to journalArticle

6 Citations (Scopus)

Abstract

We present a nanoindentation study to detect time-dependent deformations in non-polymeric hydrogenated amorphous carbon films. When the bonded hydrogen content increases from 18 to 36 at.%, as measured by Fourier transform infrared spectroscopy, we find that the film becomes less graphitic and softer. Moreover, its hardness shows a larger sensitivity to strain rate and the film with the higher hydrogen content also exhibits a larger and slower creep deformation when subjected to a step-loading experiment. The creep data compares well to the Burgess model and we discuss the influence of Van der Waals bonds on the deformation of the carbon network. (c) 2006 Elsevier B.V. All rights reserved.
LanguageEnglish
Pages223-230
JournalThin Solid Films
Volume514
Issue number1-2
DOIs
Publication statusPublished - Aug 2006

Fingerprint

carbon
hydrogen
nanoindentation
strain rate
hardness
infrared spectroscopy
sensitivity

Keywords

  • carbon
  • creep
  • Fourier transform infrared spectroscopy
  • Raman scattering

Cite this

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title = "Rheological analysis of creep in hydrogenated amorphous carbon films",
abstract = "We present a nanoindentation study to detect time-dependent deformations in non-polymeric hydrogenated amorphous carbon films. When the bonded hydrogen content increases from 18 to 36 at.{\%}, as measured by Fourier transform infrared spectroscopy, we find that the film becomes less graphitic and softer. Moreover, its hardness shows a larger sensitivity to strain rate and the film with the higher hydrogen content also exhibits a larger and slower creep deformation when subjected to a step-loading experiment. The creep data compares well to the Burgess model and we discuss the influence of Van der Waals bonds on the deformation of the carbon network. (c) 2006 Elsevier B.V. All rights reserved.",
keywords = "carbon, creep, Fourier transform infrared spectroscopy, Raman scattering",
author = "P Lemoine and JP Quinn and PD Maguire and P Papakonstantinou and N Dougan",
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Rheological analysis of creep in hydrogenated amorphous carbon films. / Lemoine, P; Quinn, JP; Maguire, PD; Papakonstantinou, P; Dougan, N.

In: Thin Solid Films, Vol. 514, No. 1-2, 08.2006, p. 223-230.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Rheological analysis of creep in hydrogenated amorphous carbon films

AU - Lemoine, P

AU - Quinn, JP

AU - Maguire, PD

AU - Papakonstantinou, P

AU - Dougan, N

PY - 2006/8

Y1 - 2006/8

N2 - We present a nanoindentation study to detect time-dependent deformations in non-polymeric hydrogenated amorphous carbon films. When the bonded hydrogen content increases from 18 to 36 at.%, as measured by Fourier transform infrared spectroscopy, we find that the film becomes less graphitic and softer. Moreover, its hardness shows a larger sensitivity to strain rate and the film with the higher hydrogen content also exhibits a larger and slower creep deformation when subjected to a step-loading experiment. The creep data compares well to the Burgess model and we discuss the influence of Van der Waals bonds on the deformation of the carbon network. (c) 2006 Elsevier B.V. All rights reserved.

AB - We present a nanoindentation study to detect time-dependent deformations in non-polymeric hydrogenated amorphous carbon films. When the bonded hydrogen content increases from 18 to 36 at.%, as measured by Fourier transform infrared spectroscopy, we find that the film becomes less graphitic and softer. Moreover, its hardness shows a larger sensitivity to strain rate and the film with the higher hydrogen content also exhibits a larger and slower creep deformation when subjected to a step-loading experiment. The creep data compares well to the Burgess model and we discuss the influence of Van der Waals bonds on the deformation of the carbon network. (c) 2006 Elsevier B.V. All rights reserved.

KW - carbon

KW - creep

KW - Fourier transform infrared spectroscopy

KW - Raman scattering

U2 - 10.1016/j.tsf.2006.02.022

DO - 10.1016/j.tsf.2006.02.022

M3 - Article

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EP - 230

JO - Thin Solid Films

T2 - Thin Solid Films

JF - Thin Solid Films

SN - 0040-6090

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