Reduced-dose and high-speed acquisition strategies for multi-dimensional electron microscopy

Zineb Saghi, Martin Benning, Rowan Leary, Manuel Macias-Montero, Ana Borras, Paul A Midgley

    Research output: Contribution to journalArticle

    20 Citations (Scopus)
    LanguageEnglish
    JournalAdvanced Structural and Chemical Imaging
    Volume1
    Issue number1
    DOIs
    Publication statusPublished - 2015

    Keywords

    • Reduced-dose
    • high-speed acquisition
    • multi-dimensional electron microscopy

    Cite this

    Saghi, Zineb ; Benning, Martin ; Leary, Rowan ; Macias-Montero, Manuel ; Borras, Ana ; Midgley, Paul A. / Reduced-dose and high-speed acquisition strategies for multi-dimensional electron microscopy. In: Advanced Structural and Chemical Imaging. 2015 ; Vol. 1, No. 1.
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    title = "Reduced-dose and high-speed acquisition strategies for multi-dimensional electron microscopy",
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    author = "Zineb Saghi and Martin Benning and Rowan Leary and Manuel Macias-Montero and Ana Borras and Midgley, {Paul A}",
    year = "2015",
    doi = "10.1186/s40679-015-0007-5",
    language = "English",
    volume = "1",
    journal = "Advanced Structural and Chemical Imaging",
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    Reduced-dose and high-speed acquisition strategies for multi-dimensional electron microscopy. / Saghi, Zineb; Benning, Martin; Leary, Rowan; Macias-Montero, Manuel; Borras, Ana; Midgley, Paul A.

    In: Advanced Structural and Chemical Imaging, Vol. 1, No. 1, 2015.

    Research output: Contribution to journalArticle

    TY - JOUR

    T1 - Reduced-dose and high-speed acquisition strategies for multi-dimensional electron microscopy

    AU - Saghi, Zineb

    AU - Benning, Martin

    AU - Leary, Rowan

    AU - Macias-Montero, Manuel

    AU - Borras, Ana

    AU - Midgley, Paul A

    PY - 2015

    Y1 - 2015

    KW - Reduced-dose

    KW - high-speed acquisition

    KW - multi-dimensional electron microscopy

    U2 - 10.1186/s40679-015-0007-5

    DO - 10.1186/s40679-015-0007-5

    M3 - Article

    VL - 1

    JO - Advanced Structural and Chemical Imaging

    T2 - Advanced Structural and Chemical Imaging

    JF - Advanced Structural and Chemical Imaging

    SN - 2198-0926

    IS - 1

    ER -