Piezoresponse force microscopy characterization of PTO thin films

Alessio Morelli, Sriram Venkatesan, George Palasantzas, Bart J. Kooi, Jeff Th M. De Hosson

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

The piezoelectric properties of PbTiO3 thin films grown by pulsed laser deposition are investigated with piezoresponse force microscopy and transmission electron microscopy. The asgrown films exhibit upward polarization, and inhomogeneous distribution of piezoelectric characteristics. The data obtained reveal imprint during piezoresponse force microscopy measurements, nonlinearity in the piezoelectric deformation, and limited retention loss. Moreover, transmission electron microscopy shows the presence of defects near the film/substrate interface, which can be associated with the variations of piezoelectric properties.

LanguageEnglish
Title of host publicationNanoscale Electromechanics and Piezoresponse Force Microscopy of Inorganic, Macromolecular and Biological Systems
Pages49-54
Number of pages6
Volume1186
Publication statusPublished - 1 Dec 2009
Event2009 MRS Spring Meeting - San Francisco, CA, United States
Duration: 13 Apr 200917 Apr 2009

Conference

Conference2009 MRS Spring Meeting
CountryUnited States
CitySan Francisco, CA
Period13/04/0917/04/09

Fingerprint

Microscopic examination
Transmission electron microscopy
microscopy
Thin films
transmission electron microscopy
Pulsed laser deposition
thin films
pulsed laser deposition
nonlinearity
Polarization
Defects
defects
Substrates
polarization

Cite this

Morelli, A., Venkatesan, S., Palasantzas, G., Kooi, B. J., & De Hosson, J. T. M. (2009). Piezoresponse force microscopy characterization of PTO thin films. In Nanoscale Electromechanics and Piezoresponse Force Microscopy of Inorganic, Macromolecular and Biological Systems (Vol. 1186, pp. 49-54)
Morelli, Alessio ; Venkatesan, Sriram ; Palasantzas, George ; Kooi, Bart J. ; De Hosson, Jeff Th M. / Piezoresponse force microscopy characterization of PTO thin films. Nanoscale Electromechanics and Piezoresponse Force Microscopy of Inorganic, Macromolecular and Biological Systems. Vol. 1186 2009. pp. 49-54
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author = "Alessio Morelli and Sriram Venkatesan and George Palasantzas and Kooi, {Bart J.} and {De Hosson}, {Jeff Th M.}",
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Morelli, A, Venkatesan, S, Palasantzas, G, Kooi, BJ & De Hosson, JTM 2009, Piezoresponse force microscopy characterization of PTO thin films. in Nanoscale Electromechanics and Piezoresponse Force Microscopy of Inorganic, Macromolecular and Biological Systems. vol. 1186, pp. 49-54, 2009 MRS Spring Meeting, San Francisco, CA, United States, 13/04/09.

Piezoresponse force microscopy characterization of PTO thin films. / Morelli, Alessio; Venkatesan, Sriram; Palasantzas, George; Kooi, Bart J.; De Hosson, Jeff Th M.

Nanoscale Electromechanics and Piezoresponse Force Microscopy of Inorganic, Macromolecular and Biological Systems. Vol. 1186 2009. p. 49-54.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

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Morelli A, Venkatesan S, Palasantzas G, Kooi BJ, De Hosson JTM. Piezoresponse force microscopy characterization of PTO thin films. In Nanoscale Electromechanics and Piezoresponse Force Microscopy of Inorganic, Macromolecular and Biological Systems. Vol. 1186. 2009. p. 49-54