Piezoresponse force microscopy characterization of PTO thin films

Alessio Morelli; Sriram Venkatesan; George Palasantzas; Bart J. Kooi; Jeff Th M. De Hosson

Piezoresponse force microscopy characterization of PTO thin films

Alessio Morelli, Sriram Venkatesan, George Palasantzas, Bart J. Kooi, Jeff Th M. De Hosson

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

The piezoelectric properties of PbTiO₃ thin films grown by pulsed laser deposition are investigated with piezoresponse force microscopy and transmission electron microscopy. The asgrown films exhibit upward polarization, and inhomogeneous distribution of piezoelectric characteristics. The data obtained reveal imprint during piezoresponse force microscopy measurements, nonlinearity in the piezoelectric deformation, and limited retention loss. Moreover, transmission electron microscopy shows the presence of defects near the film/substrate interface, which can be associated with the variations of piezoelectric properties.

Original language	English
Title of host publication	Nanoscale Electromechanics and Piezoresponse Force Microscopy of Inorganic, Macromolecular and Biological Systems
Pages	49-54
Number of pages	6
Volume	1186
Publication status	Published (in print/issue) - 1 Dec 2009
Event	2009 MRS Spring Meeting - San Francisco, CA, United States Duration: 13 Apr 2009 → 17 Apr 2009

Conference

Conference	2009 MRS Spring Meeting
Country/Territory	United States
City	San Francisco, CA
Period	13/04/09 → 17/04/09

Cite this

@inproceedings{1515ef567472416eadb46b69785d7f39,

title = "Piezoresponse force microscopy characterization of PTO thin films",

abstract = "The piezoelectric properties of PbTiO3 thin films grown by pulsed laser deposition are investigated with piezoresponse force microscopy and transmission electron microscopy. The asgrown films exhibit upward polarization, and inhomogeneous distribution of piezoelectric characteristics. The data obtained reveal imprint during piezoresponse force microscopy measurements, nonlinearity in the piezoelectric deformation, and limited retention loss. Moreover, transmission electron microscopy shows the presence of defects near the film/substrate interface, which can be associated with the variations of piezoelectric properties.",

author = "Alessio Morelli and Sriram Venkatesan and George Palasantzas and Kooi, {Bart J.} and {De Hosson}, {Jeff Th M.}",

year = "2009",

month = dec,

day = "1",

language = "English",

isbn = "9781615677894",

volume = "1186",

pages = "49--54",

booktitle = "Nanoscale Electromechanics and Piezoresponse Force Microscopy of Inorganic, Macromolecular and Biological Systems",

note = "2009 MRS Spring Meeting ; Conference date: 13-04-2009 Through 17-04-2009",

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Piezoresponse force microscopy characterization of PTO thin films. / Morelli, Alessio; Venkatesan, Sriram; Palasantzas, George et al.
Nanoscale Electromechanics and Piezoresponse Force Microscopy of Inorganic, Macromolecular and Biological Systems. Vol. 1186 2009. p. 49-54.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Piezoresponse force microscopy characterization of PTO thin films

AU - Morelli, Alessio

AU - Venkatesan, Sriram

AU - Palasantzas, George

AU - Kooi, Bart J.

AU - De Hosson, Jeff Th M.

PY - 2009/12/1

Y1 - 2009/12/1

N2 - The piezoelectric properties of PbTiO3 thin films grown by pulsed laser deposition are investigated with piezoresponse force microscopy and transmission electron microscopy. The asgrown films exhibit upward polarization, and inhomogeneous distribution of piezoelectric characteristics. The data obtained reveal imprint during piezoresponse force microscopy measurements, nonlinearity in the piezoelectric deformation, and limited retention loss. Moreover, transmission electron microscopy shows the presence of defects near the film/substrate interface, which can be associated with the variations of piezoelectric properties.

AB - The piezoelectric properties of PbTiO3 thin films grown by pulsed laser deposition are investigated with piezoresponse force microscopy and transmission electron microscopy. The asgrown films exhibit upward polarization, and inhomogeneous distribution of piezoelectric characteristics. The data obtained reveal imprint during piezoresponse force microscopy measurements, nonlinearity in the piezoelectric deformation, and limited retention loss. Moreover, transmission electron microscopy shows the presence of defects near the film/substrate interface, which can be associated with the variations of piezoelectric properties.

UR - http://www.scopus.com/inward/record.url?scp=77950557661&partnerID=8YFLogxK

M3 - Conference contribution

AN - SCOPUS:77950557661

SN - 9781615677894

VL - 1186

SP - 49

EP - 54

BT - Nanoscale Electromechanics and Piezoresponse Force Microscopy of Inorganic, Macromolecular and Biological Systems

T2 - 2009 MRS Spring Meeting

Y2 - 13 April 2009 through 17 April 2009

ER -

Piezoresponse force microscopy characterization of PTO thin films

Abstract

Conference

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