Piezoelectric properties of PbTiO3 thin films characterized with piezoresponse force and high resolution transmission electron microscopy

A. Morelli; Sriram Venkatesan; B. J. Kooi; G. Palasantzas; J. Th M. De Hosson

doi:10.1063/1.3088913

Piezoelectric properties of PbTiO₃ thin films characterized with piezoresponse force and high resolution transmission electron microscopy

A. Morelli, Sriram Venkatesan, B. J. Kooi, G. Palasantzas, J. Th M. De Hosson

Research output: Contribution to journal › Article › peer-review

5 Citations (Scopus)

Abstract

In this paper we investigate the piezoelectric properties of PbTiO3 thin films grown by pulsed laser deposition with piezoresponse force microscopy and transmission electron microscopy. The as-grown films exhibit an upward polarization, inhomogeneous distribution of piezoelectric characteristics concerning local coercive fields, and piezoelectric coefficient. In fact, the data obtained reveal imprints during piezoresponse force microscopy measurements, nonlinearity in the piezoelectric deformation, and limited polarization reversal. Moreover, transmission electron microscopy shows the presence of defects near the film/substrate interface, which can be associated with the variations of piezoelectric properties.

Original language	English
Article number	064106
Journal	Journal of Applied Physics
Volume	105
Issue number	6
DOIs	https://doi.org/10.1063/1.3088913
Publication status	Published (in print/issue) - 9 Apr 2009

Access to Document

10.1063/1.3088913

Cite this

@article{e2e8effffce04950bb9edb89f8507048,

title = "Piezoelectric properties of PbTiO3 thin films characterized with piezoresponse force and high resolution transmission electron microscopy",

abstract = "In this paper we investigate the piezoelectric properties of PbTiO3 thin films grown by pulsed laser deposition with piezoresponse force microscopy and transmission electron microscopy. The as-grown films exhibit an upward polarization, inhomogeneous distribution of piezoelectric characteristics concerning local coercive fields, and piezoelectric coefficient. In fact, the data obtained reveal imprints during piezoresponse force microscopy measurements, nonlinearity in the piezoelectric deformation, and limited polarization reversal. Moreover, transmission electron microscopy shows the presence of defects near the film/substrate interface, which can be associated with the variations of piezoelectric properties.",

author = "A. Morelli and Sriram Venkatesan and Kooi, {B. J.} and G. Palasantzas and {De Hosson}, {J. Th M.}",

year = "2009",

month = apr,

day = "9",

doi = "10.1063/1.3088913",

language = "English",

volume = "105",

journal = "Journal of Applied Physics",

issn = "0021-8979",

publisher = "American Institute of Physics",

number = "6",

}

TY - JOUR

T1 - Piezoelectric properties of PbTiO3 thin films characterized with piezoresponse force and high resolution transmission electron microscopy

AU - Morelli, A.

AU - Venkatesan, Sriram

AU - Kooi, B. J.

AU - Palasantzas, G.

AU - De Hosson, J. Th M.

PY - 2009/4/9

Y1 - 2009/4/9

N2 - In this paper we investigate the piezoelectric properties of PbTiO3 thin films grown by pulsed laser deposition with piezoresponse force microscopy and transmission electron microscopy. The as-grown films exhibit an upward polarization, inhomogeneous distribution of piezoelectric characteristics concerning local coercive fields, and piezoelectric coefficient. In fact, the data obtained reveal imprints during piezoresponse force microscopy measurements, nonlinearity in the piezoelectric deformation, and limited polarization reversal. Moreover, transmission electron microscopy shows the presence of defects near the film/substrate interface, which can be associated with the variations of piezoelectric properties.

AB - In this paper we investigate the piezoelectric properties of PbTiO3 thin films grown by pulsed laser deposition with piezoresponse force microscopy and transmission electron microscopy. The as-grown films exhibit an upward polarization, inhomogeneous distribution of piezoelectric characteristics concerning local coercive fields, and piezoelectric coefficient. In fact, the data obtained reveal imprints during piezoresponse force microscopy measurements, nonlinearity in the piezoelectric deformation, and limited polarization reversal. Moreover, transmission electron microscopy shows the presence of defects near the film/substrate interface, which can be associated with the variations of piezoelectric properties.

UR - http://www.scopus.com/inward/record.url?scp=63749083324&partnerID=8YFLogxK

U2 - 10.1063/1.3088913

DO - 10.1063/1.3088913

M3 - Article

AN - SCOPUS:63749083324

SN - 0021-8979

VL - 105

JO - Journal of Applied Physics

JF - Journal of Applied Physics

IS - 6

M1 - 064106

ER -

Piezoelectric properties of PbTiO₃ thin films characterized with piezoresponse force and high resolution transmission electron microscopy

Abstract

Access to Document

Other files and links

Fingerprint

Cite this