Piezoelectric properties of PbTiO3 thin films characterized with piezoresponse force and high resolution transmission electron microscopy

A. Morelli, Sriram Venkatesan, B. J. Kooi, G. Palasantzas, J. Th M. De Hosson

Research output: Contribution to journalArticle

5 Citations (Scopus)

Abstract

In this paper we investigate the piezoelectric properties of PbTiO3 thin films grown by pulsed laser deposition with piezoresponse force microscopy and transmission electron microscopy. The as-grown films exhibit an upward polarization, inhomogeneous distribution of piezoelectric characteristics concerning local coercive fields, and piezoelectric coefficient. In fact, the data obtained reveal imprints during piezoresponse force microscopy measurements, nonlinearity in the piezoelectric deformation, and limited polarization reversal. Moreover, transmission electron microscopy shows the presence of defects near the film/substrate interface, which can be associated with the variations of piezoelectric properties.

LanguageEnglish
Article number064106
JournalJournal of Applied Physics
Volume105
Issue number6
DOIs
Publication statusPublished - 9 Apr 2009

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microscopy
transmission electron microscopy
high resolution
polarization
thin films
pulsed laser deposition
nonlinearity
defects
coefficients

Cite this

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title = "Piezoelectric properties of PbTiO3 thin films characterized with piezoresponse force and high resolution transmission electron microscopy",
abstract = "In this paper we investigate the piezoelectric properties of PbTiO3 thin films grown by pulsed laser deposition with piezoresponse force microscopy and transmission electron microscopy. The as-grown films exhibit an upward polarization, inhomogeneous distribution of piezoelectric characteristics concerning local coercive fields, and piezoelectric coefficient. In fact, the data obtained reveal imprints during piezoresponse force microscopy measurements, nonlinearity in the piezoelectric deformation, and limited polarization reversal. Moreover, transmission electron microscopy shows the presence of defects near the film/substrate interface, which can be associated with the variations of piezoelectric properties.",
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Piezoelectric properties of PbTiO3 thin films characterized with piezoresponse force and high resolution transmission electron microscopy. / Morelli, A.; Venkatesan, Sriram; Kooi, B. J.; Palasantzas, G.; De Hosson, J. Th M.

In: Journal of Applied Physics, Vol. 105, No. 6, 064106, 09.04.2009.

Research output: Contribution to journalArticle

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