Abstract
A key requirement for modern Networks-on-Chip (NoC) is the ability to detect and diagnose faults and failures. A novel approach is proposed which addresses the challenge of fault detection using an online mechanism. The approach minimises online intrusion by employing dynamic rates of testing to maximize NoC throughput while still ensuring sufficient testing. This is achieved using a novel Monitor Module based on the back-off algorithm. The paper presents results on the minimal impact on the intrusion of the NoC for a range of test conditions and also highlights the low area/power overheads for scalability.
Original language | English |
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Title of host publication | Unknown Host Publication |
Publisher | IEEE |
Number of pages | 8 |
Publication status | Published (in print/issue) - 17 Jul 2014 |
Event | NASA/ESA Conference on Adaptive Hardware and Systems (AHS-2014) - Leicester, UK Duration: 17 Jul 2014 → … |
Conference
Conference | NASA/ESA Conference on Adaptive Hardware and Systems (AHS-2014) |
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Period | 17/07/14 → … |
Keywords
- Networks-on-Chip
- Fault detection
- Online testing
- Low area/power overhead