Nonlinear Harmonics: A Gateway to Enhanced Image Contrast and Material Discrimination

Recent advancements in atomic force microscopy (AFM) have enabled detailed exploration of materials at the molecular and atomic levels. These developments, however, pose a challenge: the data generated by microscopic and spectroscopic experiments are increasing rapidly in both size and complexity. Extracting meaningful physical insights from these datasets is challenging, particularly for multilayer heterogeneous nanoscale structures. In this paper, an unsupervised approach is presented to enhance AFM image contrast by analyzing the nonlinear response of a cantilever interacting with a material's surface using a wavelet‐based AFM. This method simultaneously measures different frequencies and harmonics in a single scan, without the need for additional hardware and exciting multiple cantilevers' eigenmodes. This developed AFM image contrast enhancement (AFM‐ICE) approach employs unsupervised learning, image processing, and image fusion techniques. The method is applied to interpret complex multilayer structures consist of defects, deposited nanoparticles and heterogeneities. Its substantial capability is demonstrated to improve image contrast and differentiate between various components. This methodology can pave the way for rapid and precise determination of material properties with enhanced resolution.