Near edge x-ray absorption fine structure study of aligned pi-bonded carbon structures in nitrogenated ta-C films

SS Roy; R McCann; P Papakonstantinou; JAD McLaughlin; IW Kirkman; Basab Bhattacharya; SRP Silva

doi:10.1063/1.2173046

Near edge x-ray absorption fine structure study of aligned pi-bonded carbon structures in nitrogenated ta-C films

SS Roy, R McCann, P Papakonstantinou, JAD McLaughlin, IW Kirkman, Basab Bhattacharya, SRP Silva

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Abstract

Polarization dependent studies of near edge x-ray absorption fine structure (NEXAFS) show evidence for the presence of aligned pi-bonded carbon structures and the formation of a nonplanar CN phase in tetrahedral amorphous nitrogenated carbon (ta-CN) films deposited at room temperature. Moreover, the analysis of NEXAFS data as a function of nitrogen concentration and annealing temperature leads to a comprehensive assignment of the local CN bonding configurations in these ta-CN films and suggests an unusual and almost thermally stable nitrogenated carbon structure. (c) 2006 American Institute of Physics.

Original language	English
Pages (from-to)	043511-043515
Journal	Journal of Applied Physics
Volume	99
Issue number	4
DOIs	https://doi.org/10.1063/1.2173046
Publication status	Published (in print/issue) - Feb 2006

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Near edge x-ray absorption fine structure study of aligned TT-bonded carbon structures in nitrogenated ta-C filmsFinal published version, 128 KB

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abstract = "Polarization dependent studies of near edge x-ray absorption fine structure (NEXAFS) show evidence for the presence of aligned pi-bonded carbon structures and the formation of a nonplanar CN phase in tetrahedral amorphous nitrogenated carbon (ta-CN) films deposited at room temperature. Moreover, the analysis of NEXAFS data as a function of nitrogen concentration and annealing temperature leads to a comprehensive assignment of the local CN bonding configurations in these ta-CN films and suggests an unusual and almost thermally stable nitrogenated carbon structure. (c) 2006 American Institute of Physics.",

author = "SS Roy and R McCann and P Papakonstantinou and JAD McLaughlin and IW Kirkman and Basab Bhattacharya and SRP Silva",

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AU - Roy, SS

AU - McCann, R

AU - Papakonstantinou, P

AU - McLaughlin, JAD

AU - Kirkman, IW

AU - Bhattacharya, Basab

AU - Silva, SRP

PY - 2006/2

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N2 - Polarization dependent studies of near edge x-ray absorption fine structure (NEXAFS) show evidence for the presence of aligned pi-bonded carbon structures and the formation of a nonplanar CN phase in tetrahedral amorphous nitrogenated carbon (ta-CN) films deposited at room temperature. Moreover, the analysis of NEXAFS data as a function of nitrogen concentration and annealing temperature leads to a comprehensive assignment of the local CN bonding configurations in these ta-CN films and suggests an unusual and almost thermally stable nitrogenated carbon structure. (c) 2006 American Institute of Physics.

AB - Polarization dependent studies of near edge x-ray absorption fine structure (NEXAFS) show evidence for the presence of aligned pi-bonded carbon structures and the formation of a nonplanar CN phase in tetrahedral amorphous nitrogenated carbon (ta-CN) films deposited at room temperature. Moreover, the analysis of NEXAFS data as a function of nitrogen concentration and annealing temperature leads to a comprehensive assignment of the local CN bonding configurations in these ta-CN films and suggests an unusual and almost thermally stable nitrogenated carbon structure. (c) 2006 American Institute of Physics.

UR - https://www.scopus.com/pages/publications/33644596576

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DO - 10.1063/1.2173046

M3 - Article

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EP - 43515

JO - Journal of Applied Physics

JF - Journal of Applied Physics

IS - 4

ER -

Near edge x-ray absorption fine structure study of aligned pi-bonded carbon structures in nitrogenated ta-C films

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