Near edge x-ray absorption fine structure study of aligned pi-bonded carbon structures in nitrogenated ta-C films

SS Roy, R McCann, P Papakonstantinou, JAD McLaughlin, IW Kirkman, Basab Bhattacharya, SRP Silva

Research output: Contribution to journalArticle

12 Citations (Scopus)

Abstract

Polarization dependent studies of near edge x-ray absorption fine structure (NEXAFS) show evidence for the presence of aligned pi-bonded carbon structures and the formation of a nonplanar CN phase in tetrahedral amorphous nitrogenated carbon (ta-CN) films deposited at room temperature. Moreover, the analysis of NEXAFS data as a function of nitrogen concentration and annealing temperature leads to a comprehensive assignment of the local CN bonding configurations in these ta-CN films and suggests an unusual and almost thermally stable nitrogenated carbon structure. (c) 2006 American Institute of Physics.
Original languageEnglish
Pages (from-to)043511-043515
JournalJournal of Applied Physics
Volume99
Issue number4
DOIs
Publication statusPublished - Feb 2006

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