Near edge x-ray absorption fine structure study of aligned pi-bonded carbon structures in nitrogenated ta-C films

SS Roy, R McCann, P Papakonstantinou, JAD McLaughlin, IW Kirkman, Basab Bhattacharya, SRP Silva

Research output: Contribution to journalArticle

12 Citations (Scopus)

Abstract

Polarization dependent studies of near edge x-ray absorption fine structure (NEXAFS) show evidence for the presence of aligned pi-bonded carbon structures and the formation of a nonplanar CN phase in tetrahedral amorphous nitrogenated carbon (ta-CN) films deposited at room temperature. Moreover, the analysis of NEXAFS data as a function of nitrogen concentration and annealing temperature leads to a comprehensive assignment of the local CN bonding configurations in these ta-CN films and suggests an unusual and almost thermally stable nitrogenated carbon structure. (c) 2006 American Institute of Physics.
LanguageEnglish
Pages043511-043515
JournalJournal of Applied Physics
Volume99
Issue number4
DOIs
Publication statusPublished - Feb 2006

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x ray absorption
fine structure
carbon
nitrogen
physics
annealing
room temperature
polarization
configurations
temperature

Cite this

Roy, SS ; McCann, R ; Papakonstantinou, P ; McLaughlin, JAD ; Kirkman, IW ; Bhattacharya, Basab ; Silva, SRP. / Near edge x-ray absorption fine structure study of aligned pi-bonded carbon structures in nitrogenated ta-C films. In: Journal of Applied Physics. 2006 ; Vol. 99, No. 4. pp. 043511-043515.
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abstract = "Polarization dependent studies of near edge x-ray absorption fine structure (NEXAFS) show evidence for the presence of aligned pi-bonded carbon structures and the formation of a nonplanar CN phase in tetrahedral amorphous nitrogenated carbon (ta-CN) films deposited at room temperature. Moreover, the analysis of NEXAFS data as a function of nitrogen concentration and annealing temperature leads to a comprehensive assignment of the local CN bonding configurations in these ta-CN films and suggests an unusual and almost thermally stable nitrogenated carbon structure. (c) 2006 American Institute of Physics.",
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Near edge x-ray absorption fine structure study of aligned pi-bonded carbon structures in nitrogenated ta-C films. / Roy, SS; McCann, R; Papakonstantinou, P; McLaughlin, JAD; Kirkman, IW; Bhattacharya, Basab; Silva, SRP.

In: Journal of Applied Physics, Vol. 99, No. 4, 02.2006, p. 043511-043515.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Near edge x-ray absorption fine structure study of aligned pi-bonded carbon structures in nitrogenated ta-C films

AU - Roy, SS

AU - McCann, R

AU - Papakonstantinou, P

AU - McLaughlin, JAD

AU - Kirkman, IW

AU - Bhattacharya, Basab

AU - Silva, SRP

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N2 - Polarization dependent studies of near edge x-ray absorption fine structure (NEXAFS) show evidence for the presence of aligned pi-bonded carbon structures and the formation of a nonplanar CN phase in tetrahedral amorphous nitrogenated carbon (ta-CN) films deposited at room temperature. Moreover, the analysis of NEXAFS data as a function of nitrogen concentration and annealing temperature leads to a comprehensive assignment of the local CN bonding configurations in these ta-CN films and suggests an unusual and almost thermally stable nitrogenated carbon structure. (c) 2006 American Institute of Physics.

AB - Polarization dependent studies of near edge x-ray absorption fine structure (NEXAFS) show evidence for the presence of aligned pi-bonded carbon structures and the formation of a nonplanar CN phase in tetrahedral amorphous nitrogenated carbon (ta-CN) films deposited at room temperature. Moreover, the analysis of NEXAFS data as a function of nitrogen concentration and annealing temperature leads to a comprehensive assignment of the local CN bonding configurations in these ta-CN films and suggests an unusual and almost thermally stable nitrogenated carbon structure. (c) 2006 American Institute of Physics.

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