Nanomechanical measurements on polymers using contact mode atomic force microscopy

P Lemoine; JAD McLaughlin

doi:10.1016/S0040-6090(98)01230-9

Nanomechanical measurements on polymers using contact mode atomic force microscopy

P Lemoine, JAD McLaughlin

Research output: Contribution to journal › Article › peer-review

20 Citations (Scopus)

Abstract

Contact mode atomic force microscopy (AFM) was used for measuring the nanomechanical properties of polymers. The measurements include hardness and wear testing over a submicron scale with direct imaging of the deformed surfaces. The results are discussed with a simple continuum mechanics approach and the technological limitations of the technique are also considered. (C) 1999 Elsevier Science S.A. All rights reserved.

Original language	English
Pages (from-to)	258-264
Journal	Thin Solid Films
Volume	339
Issue number	1-2
DOIs	https://doi.org/10.1016/S0040-6090(98)01230-9
Publication status	Published (in print/issue) - Feb 1999

Keywords

atomic force microscopy
hardness
polymers
surface morphology

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10.1016/S0040-6090(98)01230-9

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title = "Nanomechanical measurements on polymers using contact mode atomic force microscopy",

abstract = "Contact mode atomic force microscopy (AFM) was used for measuring the nanomechanical properties of polymers. The measurements include hardness and wear testing over a submicron scale with direct imaging of the deformed surfaces. The results are discussed with a simple continuum mechanics approach and the technological limitations of the technique are also considered. (C) 1999 Elsevier Science S.A. All rights reserved.",

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author = "P Lemoine and JAD McLaughlin",

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AU - McLaughlin, JAD

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AB - Contact mode atomic force microscopy (AFM) was used for measuring the nanomechanical properties of polymers. The measurements include hardness and wear testing over a submicron scale with direct imaging of the deformed surfaces. The results are discussed with a simple continuum mechanics approach and the technological limitations of the technique are also considered. (C) 1999 Elsevier Science S.A. All rights reserved.

KW - atomic force microscopy

KW - hardness

KW - polymers

KW - surface morphology

UR - https://www.scopus.com/pages/publications/0033534949

U2 - 10.1016/S0040-6090(98)01230-9

DO - 10.1016/S0040-6090(98)01230-9

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JO - Thin Solid Films

JF - Thin Solid Films

IS - 1-2

ER -

Nanomechanical measurements on polymers using contact mode atomic force microscopy

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Keywords

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