Contact mode atomic force microscopy (AFM) was used for measuring the nanomechanical properties of polymers. The measurements include hardness and wear testing over a submicron scale with direct imaging of the deformed surfaces. The results are discussed with a simple continuum mechanics approach and the technological limitations of the technique are also considered. (C) 1999 Elsevier Science S.A. All rights reserved.
|Journal||Thin Solid Films|
|Publication status||Published (in print/issue) - Feb 1999|
- atomic force microscopy
- surface morphology