Nanomechanical measurements on polymers using contact mode atomic force microscopy

P Lemoine; JAD McLaughlin

Nanomechanical measurements on polymers using contact mode atomic force microscopy

Research output: Contribution to journal › Article › peer-review

Abstract

Contact mode atomic force microscopy (AFM) was used for measuring the nanomechanical properties of polymers. The measurements include hardness and wear testing over a submicron scale with direct imaging of the deformed surfaces. The results are discussed with a simple continuum mechanics approach and the technological limitations of the technique are also considered. (C) 1999 Elsevier Science S.A. All rights reserved.

Original language	English
Pages (from-to)	258-264
Journal	Thin Solid Films
Volume	339
Issue number	1-2
Publication status	Published - Feb 1999

Keywords

atomic force microscopy
hardness
polymers
surface morphology

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title = "Nanomechanical measurements on polymers using contact mode atomic force microscopy",

abstract = "Contact mode atomic force microscopy (AFM) was used for measuring the nanomechanical properties of polymers. The measurements include hardness and wear testing over a submicron scale with direct imaging of the deformed surfaces. The results are discussed with a simple continuum mechanics approach and the technological limitations of the technique are also considered. (C) 1999 Elsevier Science S.A. All rights reserved.",

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AU - McLaughlin, JAD

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AB - Contact mode atomic force microscopy (AFM) was used for measuring the nanomechanical properties of polymers. The measurements include hardness and wear testing over a submicron scale with direct imaging of the deformed surfaces. The results are discussed with a simple continuum mechanics approach and the technological limitations of the technique are also considered. (C) 1999 Elsevier Science S.A. All rights reserved.

KW - atomic force microscopy

KW - hardness

KW - polymers

KW - surface morphology

M3 - Article

VL - 339

SP - 258

EP - 264

JO - Thin Solid Films

JF - Thin Solid Films

SN - 0040-6090

IS - 1-2

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