Nanomechanical measurements on polymers using contact mode atomic force microscopy

P Lemoine; JAD McLaughlin

Nanomechanical measurements on polymers using contact mode atomic force microscopy

Research output: Contribution to journal › Article

Abstract

Contact mode atomic force microscopy (AFM) was used for measuring the nanomechanical properties of polymers. The measurements include hardness and wear testing over a submicron scale with direct imaging of the deformed surfaces. The results are discussed with a simple continuum mechanics approach and the technological limitations of the technique are also considered. (C) 1999 Elsevier Science S.A. All rights reserved.

Original language	English
Pages (from-to)	258-264
Journal	Thin Solid Films
Volume	339
Issue number	1-2
Publication status	Published - Feb 1999

Keywords

atomic force microscopy
hardness
polymers
surface morphology

Fingerprint Dive into the research topics of 'Nanomechanical measurements on polymers using contact mode atomic force microscopy'. Together they form a unique fingerprint.

Cite this

Lemoine, P., & McLaughlin, JAD. (1999). Nanomechanical measurements on polymers using contact mode atomic force microscopy. Thin Solid Films, 339(1-2), 258-264.

@article{004eb81a17da4354baf79de172c84039,

title = "Nanomechanical measurements on polymers using contact mode atomic force microscopy",

abstract = "Contact mode atomic force microscopy (AFM) was used for measuring the nanomechanical properties of polymers. The measurements include hardness and wear testing over a submicron scale with direct imaging of the deformed surfaces. The results are discussed with a simple continuum mechanics approach and the technological limitations of the technique are also considered. (C) 1999 Elsevier Science S.A. All rights reserved.",

keywords = "atomic force microscopy, hardness, polymers, surface morphology",

author = "P Lemoine and JAD McLaughlin",

year = "1999",

month = "2",

language = "English",

volume = "339",

pages = "258--264",

journal = "Thin Solid Films",

issn = "0040-6090",

publisher = "Elsevier",

number = "1-2",

}

TY - JOUR

T1 - Nanomechanical measurements on polymers using contact mode atomic force microscopy

AU - Lemoine, P

AU - McLaughlin, JAD

PY - 1999/2

Y1 - 1999/2

N2 - Contact mode atomic force microscopy (AFM) was used for measuring the nanomechanical properties of polymers. The measurements include hardness and wear testing over a submicron scale with direct imaging of the deformed surfaces. The results are discussed with a simple continuum mechanics approach and the technological limitations of the technique are also considered. (C) 1999 Elsevier Science S.A. All rights reserved.

AB - Contact mode atomic force microscopy (AFM) was used for measuring the nanomechanical properties of polymers. The measurements include hardness and wear testing over a submicron scale with direct imaging of the deformed surfaces. The results are discussed with a simple continuum mechanics approach and the technological limitations of the technique are also considered. (C) 1999 Elsevier Science S.A. All rights reserved.

KW - atomic force microscopy

KW - hardness

KW - polymers

KW - surface morphology

M3 - Article

VL - 339

SP - 258

EP - 264

JO - Thin Solid Films

JF - Thin Solid Films

SN - 0040-6090

IS - 1-2

ER -