Nanomechanical measurements on polymers using contact mode atomic force microscopy

P Lemoine, JAD McLaughlin

Research output: Contribution to journal › Article

19 Citations (Scopus)

Abstract

Contact mode atomic force microscopy (AFM) was used for measuring the nanomechanical properties of polymers. The measurements include hardness and wear testing over a submicron scale with direct imaging of the deformed surfaces. The results are discussed with a simple continuum mechanics approach and the technological limitations of the technique are also considered. (C) 1999 Elsevier Science S.A. All rights reserved.
LanguageEnglish
Pages258-264
JournalThin Solid Films
Volume339
Issue number1-2
Publication statusPublished - Feb 1999

Fingerprint

atomic force microscopy
continuum mechanics
polymers
hardness

Keywords

  • atomic force microscopy
  • hardness
  • polymers
  • surface morphology

Cite this

Lemoine, P ; McLaughlin, JAD. / Nanomechanical measurements on polymers using contact mode atomic force microscopy. In: Thin Solid Films. 1999 ; Vol. 339, No. 1-2. pp. 258-264.
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Lemoine, P & McLaughlin, JAD 1999, 'Nanomechanical measurements on polymers using contact mode atomic force microscopy', Thin Solid Films, vol. 339, no. 1-2, pp. 258-264.

Nanomechanical measurements on polymers using contact mode atomic force microscopy. / Lemoine, P; McLaughlin, JAD.

In: Thin Solid Films, Vol. 339, No. 1-2, 02.1999, p. 258-264.

Research output: Contribution to journal › Article

TY - JOUR

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AU - McLaughlin, JAD

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AB - Contact mode atomic force microscopy (AFM) was used for measuring the nanomechanical properties of polymers. The measurements include hardness and wear testing over a submicron scale with direct imaging of the deformed surfaces. The results are discussed with a simple continuum mechanics approach and the technological limitations of the technique are also considered. (C) 1999 Elsevier Science S.A. All rights reserved.

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KW - hardness

KW - polymers

KW - surface morphology

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Lemoine P, McLaughlin JAD. Nanomechanical measurements on polymers using contact mode atomic force microscopy. Thin Solid Films. 1999 Feb;339(1-2):258-264.