Abstract
Language | English |
---|---|
Pages | 258-264 |
Journal | Thin Solid Films |
Volume | 339 |
Issue number | 1-2 |
Publication status | Published - Feb 1999 |
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Keywords
- atomic force microscopy
- hardness
- polymers
- surface morphology
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Nanomechanical measurements on polymers using contact mode atomic force microscopy. / Lemoine, P; McLaughlin, JAD.
In: Thin Solid Films, Vol. 339, No. 1-2, 02.1999, p. 258-264.Research output: Contribution to journal › Article
TY - JOUR
T1 - Nanomechanical measurements on polymers using contact mode atomic force microscopy
AU - Lemoine, P
AU - McLaughlin, JAD
PY - 1999/2
Y1 - 1999/2
N2 - Contact mode atomic force microscopy (AFM) was used for measuring the nanomechanical properties of polymers. The measurements include hardness and wear testing over a submicron scale with direct imaging of the deformed surfaces. The results are discussed with a simple continuum mechanics approach and the technological limitations of the technique are also considered. (C) 1999 Elsevier Science S.A. All rights reserved.
AB - Contact mode atomic force microscopy (AFM) was used for measuring the nanomechanical properties of polymers. The measurements include hardness and wear testing over a submicron scale with direct imaging of the deformed surfaces. The results are discussed with a simple continuum mechanics approach and the technological limitations of the technique are also considered. (C) 1999 Elsevier Science S.A. All rights reserved.
KW - atomic force microscopy
KW - hardness
KW - polymers
KW - surface morphology
M3 - Article
VL - 339
SP - 258
EP - 264
JO - Thin Solid Films
T2 - Thin Solid Films
JF - Thin Solid Films
SN - 0040-6090
IS - 1-2
ER -