Nanomechanical measurements on polymers using contact mode atomic force microscopy

P Lemoine; JAD McLaughlin

Nanomechanical measurements on polymers using contact mode atomic force microscopy

Research output: Contribution to journal › Article

Abstract

Contact mode atomic force microscopy (AFM) was used for measuring the nanomechanical properties of polymers. The measurements include hardness and wear testing over a submicron scale with direct imaging of the deformed surfaces. The results are discussed with a simple continuum mechanics approach and the technological limitations of the technique are also considered. (C) 1999 Elsevier Science S.A. All rights reserved.

Original language	English
Pages (from-to)	258-264
Journal	Thin Solid Films
Volume	339
Issue number	1-2
Publication status	Published - Feb 1999

Keywords

atomic force microscopy
hardness
polymers
surface morphology

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Lemoine, P., & McLaughlin, JAD. (1999). Nanomechanical measurements on polymers using contact mode atomic force microscopy. Thin Solid Films, 339(1-2), 258-264.

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