Abstract
Contact mode atomic force microscopy (AFM) was used for measuring the nanomechanical properties of polymers. The measurements include hardness and wear testing over a submicron scale with direct imaging of the deformed surfaces. The results are discussed with a simple continuum mechanics approach and the technological limitations of the technique are also considered. (C) 1999 Elsevier Science S.A. All rights reserved.
| Original language | English |
|---|---|
| Pages (from-to) | 258-264 |
| Journal | Thin Solid Films |
| Volume | 339 |
| Issue number | 1-2 |
| Publication status | Published - Feb 1999 |
Keywords
- atomic force microscopy
- hardness
- polymers
- surface morphology