Nanomechanical measurements on polymers using contact mode atomic force microscopy

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Contact mode atomic force microscopy (AFM) was used for measuring the nanomechanical properties of polymers. The measurements include hardness and wear testing over a submicron scale with direct imaging of the deformed surfaces. The results are discussed with a simple continuum mechanics approach and the technological limitations of the technique are also considered. (C) 1999 Elsevier Science S.A. All rights reserved.
Original languageEnglish
Pages (from-to)258-264
JournalThin Solid Films
Issue number1-2
Publication statusPublished (in print/issue) - Feb 1999


  • atomic force microscopy
  • hardness
  • polymers
  • surface morphology


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