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Nano-scale potential profiles of silicon particle detectors measured by atomic force microscopy

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)229
JournalNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Volume461
Issue number1-3
DOIs
Publication statusPublished (in print/issue) - 2001

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