Nano-scale potential profiles of silicon particle detectors measured by atomic force microscopy

A Ruzin, N Croitoru, G Lubarsky, Y Rosenwaks

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Cite this

@article{7e991c3709c84649b0b277f429ea8cc6,
title = "Nano-scale potential profiles of silicon particle detectors measured by atomic force microscopy",
author = "A Ruzin and N Croitoru and G Lubarsky and Y Rosenwaks",
year = "2001",
doi = "10.1016/S0168-9002(00)01216-X",
language = "English",
volume = "461",
pages = "229",
journal = "Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment",
issn = "0168-9002",
publisher = "Elsevier",
number = "1-3",

}

TY - JOUR

T1 - Nano-scale potential profiles of silicon particle detectors measured by atomic force microscopy

AU - Ruzin, A

AU - Croitoru, N

AU - Lubarsky, G

AU - Rosenwaks, Y

PY - 2001

Y1 - 2001

U2 - 10.1016/S0168-9002(00)01216-X

DO - 10.1016/S0168-9002(00)01216-X

M3 - Article

VL - 461

SP - 229

JO - Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

T2 - Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

JF - Nuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment

SN - 0168-9002

IS - 1-3

ER -