Nano-scale potential profiles of silicon particle detectors measured by atomic force microscopy

A Ruzin, N Croitoru, G Lubarsky, Y Rosenwaks

Research output: Contribution to journalArticle

LanguageEnglish
Pages229
JournalNuclear Instruments and Methods in Physics Research Section A: Accelerators, Spectrometers, Detectors and Associated Equipment
Volume461
Issue number1-3
DOIs
Publication statusPublished - 2001

Cite this

Ruzin, A ; Croitoru, N ; Lubarsky, G ; Rosenwaks, Y. / Nano-scale potential profiles of silicon particle detectors measured by atomic force microscopy. 2001 ; Vol. 461, No. 1-3. pp. 229.
@article{7e991c3709c84649b0b277f429ea8cc6,
title = "Nano-scale potential profiles of silicon particle detectors measured by atomic force microscopy",
author = "A Ruzin and N Croitoru and G Lubarsky and Y Rosenwaks",
year = "2001",
doi = "10.1016/S0168-9002(00)01216-X",
language = "English",
volume = "461",
pages = "229",
number = "1-3",

}

Nano-scale potential profiles of silicon particle detectors measured by atomic force microscopy. / Ruzin, A; Croitoru, N; Lubarsky, G; Rosenwaks, Y.

Vol. 461, No. 1-3, 2001, p. 229.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Nano-scale potential profiles of silicon particle detectors measured by atomic force microscopy

AU - Ruzin, A

AU - Croitoru, N

AU - Lubarsky, G

AU - Rosenwaks, Y

PY - 2001

Y1 - 2001

U2 - 10.1016/S0168-9002(00)01216-X

DO - 10.1016/S0168-9002(00)01216-X

M3 - Article

VL - 461

SP - 229

IS - 1-3

ER -