Monitoring laser-induced microstructural changes of thin film hydrogenated amorphous carbon (a-C : H) using Raman spectroscopy

RW Lamberton, SM Morley, PD Maguire, JAD McLaughlin

Research output: Contribution to journalArticle

Abstract

Thin films (10 - 150 nm) of a-C:H on glass and silicon substrates have been studied utilizing a confocal micro Raman system using an argon ion laser (514.5 nm) and helium-neon (He-Ne) laser (637.8 nm) for sample excitation. The relationship between the measured Raman spectrum and the film thickness, substrate material, laser intensity and exposure time, have been assessed. From this, the dominant variables have been identified. Microstructural changes in the form of the growth of graphitic crystallites, similar to that of thermally annealed samples, have been observed. For longer laser irradiation exposure times this graphitic component decreases, revealing an amorphous carbon structure, possibly containing some tt tetrahedrally-bonded carbon. Optical microscopy and topographical atomic force microscopy also highlight the range of laser ablated conditions that result. (C) 1998 Elsevier Science S.A. All rights reserved.
LanguageEnglish
Pages114-125
JournalThin Solid Films
Volume333
Issue number1-2
Publication statusPublished - Nov 1998

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Raman spectroscopy
carbon
thin films
helium-neon lasers
lasers
laser materials
crystallites
film thickness
argon
atomic force microscopy
Raman spectra
microscopy
irradiation
glass
silicon
excitation
ions

Keywords

  • diamond-like carbon
  • hydrogenated amorphous carbon (a-C : H)
  • laser irradiation
  • Raman scattering

Cite this

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abstract = "Thin films (10 - 150 nm) of a-C:H on glass and silicon substrates have been studied utilizing a confocal micro Raman system using an argon ion laser (514.5 nm) and helium-neon (He-Ne) laser (637.8 nm) for sample excitation. The relationship between the measured Raman spectrum and the film thickness, substrate material, laser intensity and exposure time, have been assessed. From this, the dominant variables have been identified. Microstructural changes in the form of the growth of graphitic crystallites, similar to that of thermally annealed samples, have been observed. For longer laser irradiation exposure times this graphitic component decreases, revealing an amorphous carbon structure, possibly containing some tt tetrahedrally-bonded carbon. Optical microscopy and topographical atomic force microscopy also highlight the range of laser ablated conditions that result. (C) 1998 Elsevier Science S.A. All rights reserved.",
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Monitoring laser-induced microstructural changes of thin film hydrogenated amorphous carbon (a-C : H) using Raman spectroscopy. / Lamberton, RW; Morley, SM; Maguire, PD; McLaughlin, JAD.

In: Thin Solid Films, Vol. 333, No. 1-2, 11.1998, p. 114-125.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Monitoring laser-induced microstructural changes of thin film hydrogenated amorphous carbon (a-C : H) using Raman spectroscopy

AU - Lamberton, RW

AU - Morley, SM

AU - Maguire, PD

AU - McLaughlin, JAD

PY - 1998/11

Y1 - 1998/11

N2 - Thin films (10 - 150 nm) of a-C:H on glass and silicon substrates have been studied utilizing a confocal micro Raman system using an argon ion laser (514.5 nm) and helium-neon (He-Ne) laser (637.8 nm) for sample excitation. The relationship between the measured Raman spectrum and the film thickness, substrate material, laser intensity and exposure time, have been assessed. From this, the dominant variables have been identified. Microstructural changes in the form of the growth of graphitic crystallites, similar to that of thermally annealed samples, have been observed. For longer laser irradiation exposure times this graphitic component decreases, revealing an amorphous carbon structure, possibly containing some tt tetrahedrally-bonded carbon. Optical microscopy and topographical atomic force microscopy also highlight the range of laser ablated conditions that result. (C) 1998 Elsevier Science S.A. All rights reserved.

AB - Thin films (10 - 150 nm) of a-C:H on glass and silicon substrates have been studied utilizing a confocal micro Raman system using an argon ion laser (514.5 nm) and helium-neon (He-Ne) laser (637.8 nm) for sample excitation. The relationship between the measured Raman spectrum and the film thickness, substrate material, laser intensity and exposure time, have been assessed. From this, the dominant variables have been identified. Microstructural changes in the form of the growth of graphitic crystallites, similar to that of thermally annealed samples, have been observed. For longer laser irradiation exposure times this graphitic component decreases, revealing an amorphous carbon structure, possibly containing some tt tetrahedrally-bonded carbon. Optical microscopy and topographical atomic force microscopy also highlight the range of laser ablated conditions that result. (C) 1998 Elsevier Science S.A. All rights reserved.

KW - diamond-like carbon

KW - hydrogenated amorphous carbon (a-C : H)

KW - laser irradiation

KW - Raman scattering

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JO - Thin Solid Films

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