MCMC-based algorithm to adjust scale bias in large series of electron microscopical ultrathin sections

Huaizhong Zhang, E. Patricia Rodriguez, Philip Morrow, Sally McClean, Kurt Saetzler

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Original language	English
Title of host publication	Unknown Host Publication
Pages	557-564
Number of pages	8
Publication status	Published (in print/issue) - 2009
Event	Proceedings of the 13th International Conference on Computer Analysis of Images and Patterns - Duration: 1 Jan 2009 → …

Conference	Proceedings of the 13th International Conference on Computer Analysis of Images and Patterns
Period	1/01/09 → …

Access to Document

@inproceedings{e08b939fa5ca41258eae9dae3f36e798,

title = "MCMC-based algorithm to adjust scale bias in large series of electron microscopical ultrathin sections",

author = "Huaizhong Zhang and Rodriguez, {E. Patricia} and Philip Morrow and Sally McClean and Kurt Saetzler",

year = "2009",

language = "English",

pages = "557--564",

booktitle = "Unknown Host Publication",

note = "Proceedings of the 13th International Conference on Computer Analysis of Images and Patterns ; Conference date: 01-01-2009",

}

TY - GEN

T1 - MCMC-based algorithm to adjust scale bias in large series of electron microscopical ultrathin sections

AU - Zhang, Huaizhong

AU - Rodriguez, E. Patricia

AU - Morrow, Philip

AU - McClean, Sally

AU - Saetzler, Kurt

PY - 2009

Y1 - 2009

M3 - Conference contribution

SP - 557

EP - 564

BT - Unknown Host Publication

T2 - Proceedings of the 13th International Conference on Computer Analysis of Images and Patterns

Y2 - 1 January 2009

ER -