MCMC-based algorithm to adjust scale bias in large series of electron microscopical ultrathin sections

Huaizhong Zhang, E. Patricia Rodriguez, Philip Morrow, Sally McClean, Kurt Saetzler

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationUnknown Host Publication
Pages557-564
Number of pages8
Publication statusPublished - 2009
EventProceedings of the 13th International Conference on Computer Analysis of Images and Patterns -
Duration: 1 Jan 2009 → …

Conference

ConferenceProceedings of the 13th International Conference on Computer Analysis of Images and Patterns
Period1/01/09 → …

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