MCMC-based algorithm to adjust scale bias in large series of electron microscopical ultrathin sections

Huaizhong Zhang, E. Patricia Rodriguez, Philip Morrow, Sally McClean, Kurt Saetzler

Research output: Chapter in Book/Report/Conference proceedingConference contribution

LanguageEnglish
Title of host publicationUnknown Host Publication
Pages557-564
Number of pages8
Publication statusPublished - 2009
EventProceedings of the 13th International Conference on Computer Analysis of Images and Patterns -
Duration: 1 Jan 2009 → …

Conference

ConferenceProceedings of the 13th International Conference on Computer Analysis of Images and Patterns
Period1/01/09 → …

Cite this

@inproceedings{e08b939fa5ca41258eae9dae3f36e798,
title = "MCMC-based algorithm to adjust scale bias in large series of electron microscopical ultrathin sections",
author = "Huaizhong Zhang and Rodriguez, {E. Patricia} and Philip Morrow and Sally McClean and Kurt Saetzler",
year = "2009",
language = "English",
pages = "557--564",
booktitle = "Unknown Host Publication",

}

Zhang, H, Rodriguez, EP, Morrow, P, McClean, S & Saetzler, K 2009, MCMC-based algorithm to adjust scale bias in large series of electron microscopical ultrathin sections. in Unknown Host Publication. pp. 557-564, Proceedings of the 13th International Conference on Computer Analysis of Images and Patterns, 1/01/09.

MCMC-based algorithm to adjust scale bias in large series of electron microscopical ultrathin sections. / Zhang, Huaizhong; Rodriguez, E. Patricia; Morrow, Philip; McClean, Sally; Saetzler, Kurt.

Unknown Host Publication. 2009. p. 557-564.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

TY - GEN

T1 - MCMC-based algorithm to adjust scale bias in large series of electron microscopical ultrathin sections

AU - Zhang, Huaizhong

AU - Rodriguez, E. Patricia

AU - Morrow, Philip

AU - McClean, Sally

AU - Saetzler, Kurt

PY - 2009

Y1 - 2009

M3 - Conference contribution

SP - 557

EP - 564

BT - Unknown Host Publication

ER -