Abstract
Failure of modern complex systems or processes has immense implications on society regarding efficiency, performance, safety, resource wastage, economic losses, and technological stagnation. The inherent complexity of multistage processes increases the probable occurrence of potential failures at respective stages and makes their operations more vulnerable to random unavailability. In this work, we propose a suitable measurement and management approach to the multistage stochastic processes facing 0-1 type failure. The proposed approach is generic and applies to varied contexts such as manufacturing, customer service, disease diagnosis, surgery/spread prevention, computer networks, and software development.
Original language | English |
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Title of host publication | 2023 IEEE Smart World Congress (SWC) |
Publisher | IEEE |
Pages | 1-4 |
Number of pages | 4 |
ISBN (Electronic) | 979-8-3503-1980-4 |
ISBN (Print) | 979-8-3503-1981-1 |
DOIs | |
Publication status | Published online - 1 Mar 2024 |
Publication series
Name | 2023 IEEE Smart World Congress (SWC) |
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Publisher | IEEE Control Society |
Bibliographical note
Publisher Copyright:© 2023 IEEE.
Keywords
- Reliability
- stochastic processes
- multistage
- redundancy
- process failure