Inversion phenomenon as a result of junction damages in neutron irradiated silicon detectors

G Golan, E Rabinovich, A Inberg, A Axelevitch, G Lubarsky, P Rancoita, M Demarchi, A Seidman, N Croitoru

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	67
Journal	Microelectronics Reliability
Volume	41
Issue number	1
DOIs	https://doi.org/10.1016/S0026-2714(00)00212-2
Publication status	Published (in print/issue) - 2001

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title = "Inversion phenomenon as a result of junction damages in neutron irradiated silicon detectors",

author = "G Golan and E Rabinovich and A Inberg and A Axelevitch and G Lubarsky and P Rancoita and M Demarchi and A Seidman and N Croitoru",

year = "2001",

doi = "10.1016/S0026-2714(00)00212-2",

language = "English",

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pages = "67",

journal = "Microelectronics Reliability",

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T1 - Inversion phenomenon as a result of junction damages in neutron irradiated silicon detectors

AU - Golan, G

AU - Rabinovich, E

AU - Inberg, A

AU - Axelevitch, A

AU - Lubarsky, G

AU - Rancoita, P

AU - Demarchi, M

AU - Seidman, A

AU - Croitoru, N

PY - 2001

Y1 - 2001

UR - https://www.scopus.com/pages/publications/0035155918

U2 - 10.1016/S0026-2714(00)00212-2

DO - 10.1016/S0026-2714(00)00212-2

M3 - Article

SN - 0026-2714

VL - 41

SP - 67

JO - Microelectronics Reliability

JF - Microelectronics Reliability

IS - 1

ER -