Influence of the interfacing with an electrically inhomogeneous bottom electrode on the ferroelectric properties of epitaxial PbTiO3

Yunseok Kim; Stephen Jesse; Alessio Morelli; Sergei V. Kalinin; Ionela Vrejoiu

doi:10.1063/1.4828743

Influence of the interfacing with an electrically inhomogeneous bottom electrode on the ferroelectric properties of epitaxial PbTiO₃

Yunseok Kim, Stephen Jesse, Alessio Morelli, Sergei V. Kalinin, Ionela Vrejoiu

Research output: Contribution to journal › Article › peer-review

3 Citations (Scopus)

Abstract

The influence of an electrically inhomogeneous epitaxial bottom layer on the ferroelectric and electrical properties has been explored in epitaxial PbTiO₃ (PTO)/La_0.7Sr_0.3MnO₃ (LSMO) submicron structures using atomic force microscopy. The submicron LSMO-dot structures underneath the ferroelectric PTO film allow exploring gradual changes in material properties. The LSMO interfacial layer influences significantly both electrical and ferroelectric properties of the upper PTO layer. The obtained results show that the as-grown polarization state of an epitaxial ferroelectric layer is strongly influenced by the properties of the layer on top of which it is deposited.

Original language	English
Article number	192901
Journal	Applied Physics Letters
Volume	103
Issue number	19
DOIs	https://doi.org/10.1063/1.4828743
Publication status	Published (in print/issue) - 4 Nov 2013

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@article{4e78cb268e5b42f692891d1f189d4e03,

title = "Influence of the interfacing with an electrically inhomogeneous bottom electrode on the ferroelectric properties of epitaxial PbTiO3",

abstract = "The influence of an electrically inhomogeneous epitaxial bottom layer on the ferroelectric and electrical properties has been explored in epitaxial PbTiO3 (PTO)/La0.7Sr0.3MnO3 (LSMO) submicron structures using atomic force microscopy. The submicron LSMO-dot structures underneath the ferroelectric PTO film allow exploring gradual changes in material properties. The LSMO interfacial layer influences significantly both electrical and ferroelectric properties of the upper PTO layer. The obtained results show that the as-grown polarization state of an epitaxial ferroelectric layer is strongly influenced by the properties of the layer on top of which it is deposited.",

author = "Yunseok Kim and Stephen Jesse and Alessio Morelli and Kalinin, {Sergei V.} and Ionela Vrejoiu",

year = "2013",

month = nov,

day = "4",

doi = "10.1063/1.4828743",

language = "English",

volume = "103",

journal = "Applied Physics Letters",

issn = "0003-6951",

publisher = "AIP Publishing",

number = "19",

}

TY - JOUR

T1 - Influence of the interfacing with an electrically inhomogeneous bottom electrode on the ferroelectric properties of epitaxial PbTiO3

AU - Kim, Yunseok

AU - Jesse, Stephen

AU - Morelli, Alessio

AU - Kalinin, Sergei V.

AU - Vrejoiu, Ionela

PY - 2013/11/4

Y1 - 2013/11/4

N2 - The influence of an electrically inhomogeneous epitaxial bottom layer on the ferroelectric and electrical properties has been explored in epitaxial PbTiO3 (PTO)/La0.7Sr0.3MnO3 (LSMO) submicron structures using atomic force microscopy. The submicron LSMO-dot structures underneath the ferroelectric PTO film allow exploring gradual changes in material properties. The LSMO interfacial layer influences significantly both electrical and ferroelectric properties of the upper PTO layer. The obtained results show that the as-grown polarization state of an epitaxial ferroelectric layer is strongly influenced by the properties of the layer on top of which it is deposited.

AB - The influence of an electrically inhomogeneous epitaxial bottom layer on the ferroelectric and electrical properties has been explored in epitaxial PbTiO3 (PTO)/La0.7Sr0.3MnO3 (LSMO) submicron structures using atomic force microscopy. The submicron LSMO-dot structures underneath the ferroelectric PTO film allow exploring gradual changes in material properties. The LSMO interfacial layer influences significantly both electrical and ferroelectric properties of the upper PTO layer. The obtained results show that the as-grown polarization state of an epitaxial ferroelectric layer is strongly influenced by the properties of the layer on top of which it is deposited.

UR - http://www.scopus.com/inward/record.url?scp=84889855318&partnerID=8YFLogxK

U2 - 10.1063/1.4828743

DO - 10.1063/1.4828743

M3 - Article

AN - SCOPUS:84889855318

SN - 0003-6951

VL - 103

JO - Applied Physics Letters

JF - Applied Physics Letters

IS - 19

M1 - 192901

ER -

Influence of the interfacing with an electrically inhomogeneous bottom electrode on the ferroelectric properties of epitaxial PbTiO₃

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