Growth and characterisation of lead zirconate titanate (30/70) on indium tin oxide coated glass for oxide ferroelectric-liquid crystal display application

SS Roy, H Gleeson, CP Shaw, RW Whatmore, Z Huang, Q Zhang, S Dunn

    Research output: Contribution to journalArticle

    25 Citations (Scopus)

    Abstract

    The growth and characterisation of sol-gel lead zirconate titanate (PZT) (30/70) thin Films on indium tin oxide (ITO) coated glass have been investigated using X-my diffraction (XRD). transmitting electron microscopy (TEM) and atomic force microscopy (AFM). Perovskite crystallized at 550 degreesC in a random orientation. and all films showed characteristic rosette formations. A seeding and crystallisation model has been proposed to describe the rosette formation process. which is based on the ease of PbO diffusion through the film. The effect of drying temperature on annealed film properties has been examined and when optimised has been shown to improve electrical properties and film fatness. incorporation of the PZT Films into small prototype liquid crystal displays has been done. Application of pulsed poling voltages to the displays has resulted in bulk alignment of the liquid crystal adjacent to poled regions of the PZT layer which remained after the poling voltages were removed.
    LanguageEnglish
    Pages189+
    JournalIntegrated Ferroelectrics
    Volume29
    Issue number3-4
    Publication statusPublished - 2000

    Fingerprint

    indium oxides
    tin oxides
    liquid crystals
    oxides
    glass
    electric potential
    inoculation
    drying
    electron microscopy
    electrical properties
    alignment
    prototypes
    atomic force microscopy
    gels
    crystallization
    thin films
    diffraction
    temperature

    Cite this

    Roy, SS ; Gleeson, H ; Shaw, CP ; Whatmore, RW ; Huang, Z ; Zhang, Q ; Dunn, S. / Growth and characterisation of lead zirconate titanate (30/70) on indium tin oxide coated glass for oxide ferroelectric-liquid crystal display application. In: Integrated Ferroelectrics. 2000 ; Vol. 29, No. 3-4. pp. 189+.
    @article{95e05fa9f0e34752b92d7ea8be137b8d,
    title = "Growth and characterisation of lead zirconate titanate (30/70) on indium tin oxide coated glass for oxide ferroelectric-liquid crystal display application",
    abstract = "The growth and characterisation of sol-gel lead zirconate titanate (PZT) (30/70) thin Films on indium tin oxide (ITO) coated glass have been investigated using X-my diffraction (XRD). transmitting electron microscopy (TEM) and atomic force microscopy (AFM). Perovskite crystallized at 550 degreesC in a random orientation. and all films showed characteristic rosette formations. A seeding and crystallisation model has been proposed to describe the rosette formation process. which is based on the ease of PbO diffusion through the film. The effect of drying temperature on annealed film properties has been examined and when optimised has been shown to improve electrical properties and film fatness. incorporation of the PZT Films into small prototype liquid crystal displays has been done. Application of pulsed poling voltages to the displays has resulted in bulk alignment of the liquid crystal adjacent to poled regions of the PZT layer which remained after the poling voltages were removed.",
    author = "SS Roy and H Gleeson and CP Shaw and RW Whatmore and Z Huang and Q Zhang and S Dunn",
    year = "2000",
    language = "English",
    volume = "29",
    pages = "189+",
    journal = "Integrated Ferroelectrics",
    issn = "1058-4587",
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    Growth and characterisation of lead zirconate titanate (30/70) on indium tin oxide coated glass for oxide ferroelectric-liquid crystal display application. / Roy, SS; Gleeson, H; Shaw, CP; Whatmore, RW; Huang, Z; Zhang, Q; Dunn, S.

    In: Integrated Ferroelectrics, Vol. 29, No. 3-4, 2000, p. 189+.

    Research output: Contribution to journalArticle

    TY - JOUR

    T1 - Growth and characterisation of lead zirconate titanate (30/70) on indium tin oxide coated glass for oxide ferroelectric-liquid crystal display application

    AU - Roy, SS

    AU - Gleeson, H

    AU - Shaw, CP

    AU - Whatmore, RW

    AU - Huang, Z

    AU - Zhang, Q

    AU - Dunn, S

    PY - 2000

    Y1 - 2000

    N2 - The growth and characterisation of sol-gel lead zirconate titanate (PZT) (30/70) thin Films on indium tin oxide (ITO) coated glass have been investigated using X-my diffraction (XRD). transmitting electron microscopy (TEM) and atomic force microscopy (AFM). Perovskite crystallized at 550 degreesC in a random orientation. and all films showed characteristic rosette formations. A seeding and crystallisation model has been proposed to describe the rosette formation process. which is based on the ease of PbO diffusion through the film. The effect of drying temperature on annealed film properties has been examined and when optimised has been shown to improve electrical properties and film fatness. incorporation of the PZT Films into small prototype liquid crystal displays has been done. Application of pulsed poling voltages to the displays has resulted in bulk alignment of the liquid crystal adjacent to poled regions of the PZT layer which remained after the poling voltages were removed.

    AB - The growth and characterisation of sol-gel lead zirconate titanate (PZT) (30/70) thin Films on indium tin oxide (ITO) coated glass have been investigated using X-my diffraction (XRD). transmitting electron microscopy (TEM) and atomic force microscopy (AFM). Perovskite crystallized at 550 degreesC in a random orientation. and all films showed characteristic rosette formations. A seeding and crystallisation model has been proposed to describe the rosette formation process. which is based on the ease of PbO diffusion through the film. The effect of drying temperature on annealed film properties has been examined and when optimised has been shown to improve electrical properties and film fatness. incorporation of the PZT Films into small prototype liquid crystal displays has been done. Application of pulsed poling voltages to the displays has resulted in bulk alignment of the liquid crystal adjacent to poled regions of the PZT layer which remained after the poling voltages were removed.

    M3 - Article

    VL - 29

    SP - 189+

    JO - Integrated Ferroelectrics

    T2 - Integrated Ferroelectrics

    JF - Integrated Ferroelectrics

    SN - 1058-4587

    IS - 3-4

    ER -