| Language | English |
|---|---|
| Pages | 269-281 |
| Journal | IEEE Transactions on Systems, Man, and Cybernetics, Part C: Applications and Reviews |
| Volume | 31 |
| Issue number | 3 |
| DOIs | |
| Publication status | Published - 1 Aug 2001 |
Cite this
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Fault Diagnosis of Electronic Systems Using Intelligent Techniques: A Review. / Maguire, LP; Fenton, B; McGinnity, Martin.
In: IEEE Transactions on Systems, Man, and Cybernetics, Part C: Applications and Reviews, Vol. 31, No. 3, 01.08.2001, p. 269-281.Research output: Contribution to journal › Article
TY - JOUR
T1 - Fault Diagnosis of Electronic Systems Using Intelligent Techniques: A Review
AU - Maguire, LP
AU - Fenton, B
AU - McGinnity, Martin
N1 - Other Details ------------------------------------ This paper represents the culmination of collaborative research with International Test Technologies Ltd, who specialise in functional test and diagnostic solutions for processor boards. Professor John Sheppard (John Hopkins University), who reviewed the paper, indicated: “The primary contribution is that it provides a complete review of all major AI-based approaches to diagnostics. As mentioned previously, there are several papers and books that review diagnostics within the context of a particular technique; however, I have seen nothing that attempts to discuss the pros and cons across all major techniques. As such, this paper has the potential to fill an important void.”
PY - 2001/8/1
Y1 - 2001/8/1
U2 - 10.1109/5326.971655
DO - 10.1109/5326.971655
M3 - Article
VL - 31
SP - 269
EP - 281
JO - IEEE Transactions on Systems, Man, and Cybernetics, Part C: Applications and Reviews
T2 - IEEE Transactions on Systems, Man, and Cybernetics, Part C: Applications and Reviews
JF - IEEE Transactions on Systems, Man, and Cybernetics, Part C: Applications and Reviews
SN - 1094-6977
IS - 3
ER -