Fault Diagnosis of Electronic Systems Using Intelligent Techniques: A Review

LP Maguire; B Fenton; Martin McGinnity

doi:10.1109/5326.971655

Fault Diagnosis of Electronic Systems Using Intelligent Techniques: A Review

LP Maguire, B Fenton, Martin McGinnity

Faculty Of Computing, Eng. & Built Env.

Research output: Contribution to journal › Article › peer-review

164 Citations (Scopus)

Original language	English
Pages (from-to)	269-281
Journal	IEEE Transactions on Systems, Man, and Cybernetics, Part C: Applications and Reviews
Volume	31
Issue number	3
DOIs	https://doi.org/10.1109/5326.971655
Publication status	Published (in print/issue) - 1 Aug 2001

Bibliographical note

Other Details
------------------------------------
This paper represents the culmination of collaborative research with International Test Technologies Ltd, who specialise in functional test and diagnostic solutions for processor boards. Professor John Sheppard (John Hopkins University), who reviewed the paper, indicated: “The primary contribution is that it provides a complete review of all major AI-based approaches to diagnostics. As mentioned previously, there are several papers and books that review diagnostics within the context of a particular technique; however, I have seen nothing that attempts to discuss the pros and cons across all major techniques. As such, this paper has the potential to fill an important void.”

Access to Document

10.1109/5326.971655

Cite this

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