Fault Diagnosis of Electronic Systems Using Intelligent Techniques: A Review

LP Maguire; B Fenton; Martin McGinnity

doi:10.1109/5326.971655

Fault Diagnosis of Electronic Systems Using Intelligent Techniques: A Review

Research output: Contribution to journal › Article

Original language	English
Pages (from-to)	269-281
Journal	IEEE Transactions on Systems, Man, and Cybernetics, Part C: Applications and Reviews
Volume	31
Issue number	3
DOIs	https://doi.org/10.1109/5326.971655
Publication status	Published - 1 Aug 2001

Access to Document

10.1109/5326.971655

Cite this

Maguire, LP., Fenton, B., & McGinnity, M. (2001). Fault Diagnosis of Electronic Systems Using Intelligent Techniques: A Review. IEEE Transactions on Systems, Man, and Cybernetics, Part C: Applications and Reviews, 31(3), 269-281. https://doi.org/10.1109/5326.971655

@article{9fd15fc448d74634bac221243dae4300,

title = "Fault Diagnosis of Electronic Systems Using Intelligent Techniques: A Review",

author = "LP Maguire and B Fenton and Martin McGinnity",

note = "Other Details ------------------------------------ This paper represents the culmination of collaborative research with International Test Technologies Ltd, who specialise in functional test and diagnostic solutions for processor boards. Professor John Sheppard (John Hopkins University), who reviewed the paper, indicated: “The primary contribution is that it provides a complete review of all major AI-based approaches to diagnostics. As mentioned previously, there are several papers and books that review diagnostics within the context of a particular technique; however, I have seen nothing that attempts to discuss the pros and cons across all major techniques. As such, this paper has the potential to fill an important void.”",

year = "2001",

month = "8",

day = "1",

doi = "10.1109/5326.971655",

language = "English",

volume = "31",

pages = "269--281",

journal = "IEEE Transactions on Systems, Man, and Cybernetics, Part C: Applications and Reviews",

issn = "1094-6977",

publisher = "IEEE",

number = "3",

}

TY - JOUR

T1 - Fault Diagnosis of Electronic Systems Using Intelligent Techniques: A Review

AU - Maguire, LP

AU - Fenton, B

AU - McGinnity, Martin

N1 - Other Details ------------------------------------ This paper represents the culmination of collaborative research with International Test Technologies Ltd, who specialise in functional test and diagnostic solutions for processor boards. Professor John Sheppard (John Hopkins University), who reviewed the paper, indicated: “The primary contribution is that it provides a complete review of all major AI-based approaches to diagnostics. As mentioned previously, there are several papers and books that review diagnostics within the context of a particular technique; however, I have seen nothing that attempts to discuss the pros and cons across all major techniques. As such, this paper has the potential to fill an important void.”

PY - 2001/8/1

Y1 - 2001/8/1

U2 - 10.1109/5326.971655

DO - 10.1109/5326.971655

M3 - Article

VL - 31

SP - 269

EP - 281

JO - IEEE Transactions on Systems, Man, and Cybernetics, Part C: Applications and Reviews

JF - IEEE Transactions on Systems, Man, and Cybernetics, Part C: Applications and Reviews

SN - 1094-6977

IS - 3

ER -