Original language | English |
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Pages (from-to) | 16-20 |
Journal | IEEE Instrumentation and Measurement Magazine |
Volume | 5 |
Issue number | 3 |
Publication status | Published (in print/issue) - Sept 2002 |
Fault Diagnosis of Electronic Systems Using Artificial Intelligence
W Fenton, TM McGinnity, LP Maguire
Research output: Contribution to journal › Article › peer-review
15
Citations
(Scopus)