Fault Diagnosis of Electronic Systems Using Artificial Intelligence

Research output: Contribution to journalArticle

11 Citations (Scopus)
LanguageEnglish
Pages16-20
JournalIEEE Instrumentation and Measurement Magazine
Volume5
Issue number3
Publication statusPublished - Sep 2002

Cite this

@article{6a8aebe0cd3d4059b6b4eee1c1524fc9,
title = "Fault Diagnosis of Electronic Systems Using Artificial Intelligence",
author = "W Fenton and TM McGinnity and LP Maguire",
year = "2002",
month = "9",
language = "English",
volume = "5",
pages = "16--20",
journal = "IEEE Instrumentation and Measurement Magazine",
issn = "1094-6969",
number = "3",

}

Fault Diagnosis of Electronic Systems Using Artificial Intelligence. / Fenton, W; McGinnity, TM; Maguire, LP.

In: IEEE Instrumentation and Measurement Magazine, Vol. 5, No. 3, 09.2002, p. 16-20.

Research output: Contribution to journalArticle

TY - JOUR

T1 - Fault Diagnosis of Electronic Systems Using Artificial Intelligence

AU - Fenton, W

AU - McGinnity, TM

AU - Maguire, LP

PY - 2002/9

Y1 - 2002/9

M3 - Article

VL - 5

SP - 16

EP - 20

JO - IEEE Instrumentation and Measurement Magazine

T2 - IEEE Instrumentation and Measurement Magazine

JF - IEEE Instrumentation and Measurement Magazine

SN - 1094-6969

IS - 3

ER -