Fault Diagnosis of Electronic Systems Using Artificial Intelligence

W Fenton, TM McGinnity, LP Maguire

Research output: Contribution to journalArticlepeer-review

13 Citations (Scopus)
Original languageEnglish
Pages (from-to)16-20
JournalIEEE Instrumentation and Measurement Magazine
Volume5
Issue number3
Publication statusPublished - Sep 2002

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