Abstract
A micromechanical tunable capacitor fabricated using the commercial 0.35 μm complementary metal oxide semiconductor (CMOS) process and the post-process has been investigated in this study. The structure of the tunable capacitor consists of a membrane, supported beams, driving and sensing electrodes. The membrane is sustained by the supported beams. The tunable capacitor requires only one wet etching post-process to release the suspended structures. The post-process has the advantages of easy execution and low cost. The tunable capacitor contains a driving part and a sensing part. The sensing part generates a change in capacitance when applying a driving voltage to the driving part. Experimental results show that the tunable capacitor has a capacitance of 1.38 pF, a tuning range of 85% and a Q-factor of 40 at 100 MHz.
| Original language | English |
|---|---|
| Pages (from-to) | 1257-1262 |
| Number of pages | 6 |
| Journal | Microelectronics Journal |
| Volume | 38 |
| Issue number | 12 |
| DOIs | |
| Publication status | Published (in print/issue) - 1 Dec 2007 |
Funding
The authors would like to thank National Center for High-Performance Computing (NCHC) for chip simulation, National Chip Implementation Center (CIC) for chip fabrication and the National Science Council of the Republic of China for financially supporting this research under contract no. NSC 95-2221-E-005-043-MY2.
Keywords
- CMOS
- Microactuator
- Micromechanical tunable capacitor
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