@inproceedings{908542f1ea3f4f2c9c577c8678c16daa,
title = "Evidence of surface defects in ultrathin tetrahedral amorphous carbon films probed by x-ray absorption spectroscopy",
abstract = "The tetrahedral amorphous carbon (ta-C) films with thickness 1-10 nm were obtained by filtered cathodic vacuum arc deposition and investigated by near edge X-ray absorption fine structure (NEXAFS) and Raman spectroscopies. The C K (carbon K) edge NEXAFS spectra clearly revealed that the C=C bonds are more or less same for the film above 2 nm thickness. The evidence of surface defect was clearly visible for films with 1 nm thickness. The C K edge NEXAFS analysis further showed that the content of the surface defect (mainly C-H bonds) decreased with the increase thickness in the alms. The intensity of the Raman G peak increased with the increase of thickness. The X ray reflectivity measurements revealed the increased of film density with thickness.",
keywords = "Electronic structure, Raman spectroscopy, Surface defect, Tetrahedral amorphous carbon, Ultrathin film",
author = "Roy, {S. S.} and R. McCann and P. Papakonstantinou and Abbas, {G. A.} and McLaughlin, {J. A.}",
note = "Copyright: Copyright 2008 Elsevier B.V., All rights reserved.; 2006 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2006 Technical Proceedings ; Conference date: 07-05-2006 Through 11-05-2006",
year = "2006",
language = "English",
isbn = "0976798565",
series = "2006 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2006 Technical Proceedings",
pages = "797--799",
booktitle = "2006 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2006 Technical Proceedings",
}