Direct, reliable, measurement-based technique for the extraction of an on-chip HBT dummy structure

Ke Lu, Philip Perry, Thomas J. Brazil

Research output: Chapter in Book/Report/Conference proceedingConference contribution

4 Citations (Scopus)

Abstract

A reliable measurement-based technique is introduced to extract dummy structure modelling parameters which are used to deembed the intrinsic S parameters of an on-chip HBT device. The entire parameter set of the dummy structure equivalent circuit is obtained by direct processing of the measurement data, avoiding the need for computer optimisation which often produces unrealistic results. An example is given to demonstrate the method, and the structure model is applied to reveal the intrinsic device S parameters of an HBT.

Original languageEnglish
Title of host publicationIEEE International Conference on Microelectronic Test Structures
PublisherPubl by IEEE
Pages27-30
Number of pages4
ISBN (Print)0780308573
Publication statusPublished - 1 Jan 1993
Event1993 IEEE International Conference on Microelectronic Test Structures - ICMTS 93 - Barcelona, Spain
Duration: 22 Mar 199325 Mar 1993

Conference

Conference1993 IEEE International Conference on Microelectronic Test Structures - ICMTS 93
CityBarcelona, Spain
Period22/03/9325/03/93

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Cite this

Lu, K., Perry, P., & Brazil, T. J. (1993). Direct, reliable, measurement-based technique for the extraction of an on-chip HBT dummy structure. In IEEE International Conference on Microelectronic Test Structures (pp. 27-30). Publ by IEEE.