Activities per year
Abstract
Automated Optical Inspection (AOI) is widely used across various industries, including surface mount technology in semiconductor manufacturing. One of the key challenges in AOI is optimising inspection tolerances. Traditionally, this process relies heavily on the expertise and intuition of engineers, making it subjective and prone to inconsistency. To address this, we are developing an intelligent, data-driven approach to optimise inspection tolerances in a more objective and consistent manner. Most existing research in this area focuses primarily on minimising false calls, often at the risk of allowing actual defects to go undetected. This oversight can compromise product quality, especially in critical sectors such as medical, defence, and automotive industries. Our approach introduces the use of percentile rank, amongst other logical strategies, to ensure that genuine defects are not overlooked. With continued refinement, our method aims to reach a point where every flagged item is a true defect, thereby eliminating the need for manual inspection. Our proof of concept achieved an 18% reduction in false calls at the 80th percentile rank, while maintaining a 100% recall rate. This makes the system both efficient and reliable, offering significant time and cost savings.
| Original language | English |
|---|---|
| Number of pages | 4 |
| DOIs | |
| Publication status | Published online - 6 May 2025 |
UN SDGs
This output contributes to the following UN Sustainable Development Goals (SDGs)
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SDG 9 Industry, Innovation, and Infrastructure
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SDG 11 Sustainable Cities and Communities
Keywords
- Surface mount technology (SMT)
- Digital twin
- Real-time data analytics
- Tolerance optimisation
- Automated optical inspection
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Dive into the research topics of 'Design and Development of a Robust Tolerance Optimisation Framework for Automated Optical Inspection in Semiconductor Manufacturing'. Together they form a unique fingerprint.Activities
- 1 Invited talk
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Digital Twins, Fault Diagnosis, and Simulation Testbeds: From Automotive Engines to Advanced Manufacturing
Ng, M. (Speaker)
23 Apr 2026 → 24 Apr 2026Activity: Talk or presentation › Invited talk
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Design and Development of a Robust Tolerance Optimisation Framework for Automated Optical Inspection in Semiconductor Manufacturing
Kogileru, S., McBride, M., Bi, Y. & Ng, K. Y., 6 Jan 2026, (Published online) 2025 IEEE 23rd International Conference on Industrial Informatics (INDIN). IEEE, p. 1-4 4 p. (2025 IEEE 23rd International Conference on Industrial Informatics (INDIN)).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
Open AccessFile4 Downloads (Pure) -
A Robust Tolerance Optimisation Framework for Automated Optical Inspection (AOI) in Semiconductor Manufacturing
Kogileru, S., McBride, M., Bi, Y. & Ng, K. Y., Jun 2025, (Unpublished).Research output: Contribution to conference › Poster › peer-review
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