Complementary Analysis of Metallic Templates Fabricated by Nanosphere Lithography

PK Yadav, A George, JAD McLaughlin, P Lemoine

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3 Citations (Scopus)

Abstract

We present a comparative microscopic study on metallic templates prepared by nanosphere lithography. Scanning electron microscopy, low kV Energy dispersive X-ray spectroscopy, scanning ion microscopy, atomic force microscopy and confocal Raman spectroscopy were used to analyse the assembly of the nano-templates. Contact angle measurements allowed us to optimise the surface treatment of the Si substrate to obtain maximal spreading and regularity of the nanosphere arrays. After metal deposition and toluene nanosphere removal, we found the expected interstitial triangular structures, originating from the 2D single layer hexagonal sphere array. We also detected a number of other features such as rings, circles, cups and lines which were found to be generally positioned below the nanospheres. A review of proposed mechanisms and the various analysis performed here indicate that some of these features are partly polymeric and partly caused by residual material leaching out of the nanospheres at various stages of the process.
LanguageEnglish
Pages341
Journale-Journal of Surface Science and Nanotechnology
Volume7
DOIs
Publication statusPublished - 2009

Fingerprint

Nanospheres
Lithography
templates
lithography
leaching
surface treatment
regularity
toluene
interstitials
Raman spectroscopy
assembly
atomic force microscopy
microscopy
scanning electron microscopy
scanning
rings
X-Ray Emission Spectrometry
metals
Raman Spectrum Analysis
spectroscopy

Keywords

  • Nano-rings
  • Nanosphere lithography
  • Atomic force microscopy

Cite this

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title = "Complementary Analysis of Metallic Templates Fabricated by Nanosphere Lithography",
abstract = "We present a comparative microscopic study on metallic templates prepared by nanosphere lithography. Scanning electron microscopy, low kV Energy dispersive X-ray spectroscopy, scanning ion microscopy, atomic force microscopy and confocal Raman spectroscopy were used to analyse the assembly of the nano-templates. Contact angle measurements allowed us to optimise the surface treatment of the Si substrate to obtain maximal spreading and regularity of the nanosphere arrays. After metal deposition and toluene nanosphere removal, we found the expected interstitial triangular structures, originating from the 2D single layer hexagonal sphere array. We also detected a number of other features such as rings, circles, cups and lines which were found to be generally positioned below the nanospheres. A review of proposed mechanisms and the various analysis performed here indicate that some of these features are partly polymeric and partly caused by residual material leaching out of the nanospheres at various stages of the process.",
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N2 - We present a comparative microscopic study on metallic templates prepared by nanosphere lithography. Scanning electron microscopy, low kV Energy dispersive X-ray spectroscopy, scanning ion microscopy, atomic force microscopy and confocal Raman spectroscopy were used to analyse the assembly of the nano-templates. Contact angle measurements allowed us to optimise the surface treatment of the Si substrate to obtain maximal spreading and regularity of the nanosphere arrays. After metal deposition and toluene nanosphere removal, we found the expected interstitial triangular structures, originating from the 2D single layer hexagonal sphere array. We also detected a number of other features such as rings, circles, cups and lines which were found to be generally positioned below the nanospheres. A review of proposed mechanisms and the various analysis performed here indicate that some of these features are partly polymeric and partly caused by residual material leaching out of the nanospheres at various stages of the process.

AB - We present a comparative microscopic study on metallic templates prepared by nanosphere lithography. Scanning electron microscopy, low kV Energy dispersive X-ray spectroscopy, scanning ion microscopy, atomic force microscopy and confocal Raman spectroscopy were used to analyse the assembly of the nano-templates. Contact angle measurements allowed us to optimise the surface treatment of the Si substrate to obtain maximal spreading and regularity of the nanosphere arrays. After metal deposition and toluene nanosphere removal, we found the expected interstitial triangular structures, originating from the 2D single layer hexagonal sphere array. We also detected a number of other features such as rings, circles, cups and lines which were found to be generally positioned below the nanospheres. A review of proposed mechanisms and the various analysis performed here indicate that some of these features are partly polymeric and partly caused by residual material leaching out of the nanospheres at various stages of the process.

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KW - Atomic force microscopy

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