Commercial Challenges and Quality Robustness Issue in Semiconductor Manufacture Test and Measurement

Computer Science

• Development Process 100%
• Commercial Challenge 100%
• Software Engineering Method 50%
• Commercial Advantage 50%
• Coverage Test 50%
• Open Source 50%
• Integrated Solution 50%
• Measurement Method 50%
• Quality Requirement 50%
• Proprietary Tool 50%
• System-on-Chip 50%

Engineering

• Test Program 100%
• Development Process 100%
• System-on-Chip 50%
• Test Technique 50%
• Test Time 50%
• Engineering Method 50%
• Integrated Circuit 50%
• Mass Production 50%