Commercial Challenges and Quality Robustness Issue in Semiconductor Manufacture Test and Measurement

S Vock, OJ Escalona, FJ Owens

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Today’s economical cycles also challenge the test program development process for semiconductors with regard to economics, productivity, time to market and increasing quality requirements while at the same time the complexity of the system-on-chip Integrated Circuits to be tested is increasingly significant. Furthermore to increase competitive advantage, especially in mass production, the developed and applied test and measurement methods have to be state of the art ensuring shortest possible test times while at the same time best test coverage and robustness has to be achieved. This paper presents a novel way of addressing these challenges, by applying software engineering methods and software test techniques to the test program development process. Employing open source based software creates an integrated solution and workspace while additionally providing the necessary tool support. This leads to commercial advantages, and additionally offers a potential roadmap away from proprietary tools sets.
LanguageEnglish
Title of host publicationUnknown Host Publication
EditorsValerie Butler
Place of Publicationwww
Number of pages8
Publication statusPublished - 15 Dec 2010
Event27th International Manufacturing Conference - Galway Institute of Technology
Duration: 15 Dec 2010 → …
http://imc27.com/

Conference

Conference27th International Manufacturing Conference
Period15/12/10 → …
Internet address

Fingerprint

Semiconductor materials
Integrated circuits
Software engineering
Productivity
Economics
System-on-chip

Keywords

  • Design-for-manufacture
  • Integrated Circuits Fabrication
  • Productivity Improvement
  • Quality
  • Semiconductor Manufacture
  • Production Software Test
  • Test Automatisation

Cite this

Vock, S., Escalona, OJ., & Owens, FJ. (2010). Commercial Challenges and Quality Robustness Issue in Semiconductor Manufacture Test and Measurement. In V. Butler (Ed.), Unknown Host Publication www.
Vock, S ; Escalona, OJ ; Owens, FJ. / Commercial Challenges and Quality Robustness Issue in Semiconductor Manufacture Test and Measurement. Unknown Host Publication. editor / Valerie Butler. www, 2010.
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Vock, S, Escalona, OJ & Owens, FJ 2010, Commercial Challenges and Quality Robustness Issue in Semiconductor Manufacture Test and Measurement. in V Butler (ed.), Unknown Host Publication. www, 27th International Manufacturing Conference, 15/12/10.

Commercial Challenges and Quality Robustness Issue in Semiconductor Manufacture Test and Measurement. / Vock, S; Escalona, OJ; Owens, FJ.

Unknown Host Publication. ed. / Valerie Butler. www, 2010.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

TY - GEN

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AU - Escalona, OJ

AU - Owens, FJ

PY - 2010/12/15

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N2 - Today’s economical cycles also challenge the test program development process for semiconductors with regard to economics, productivity, time to market and increasing quality requirements while at the same time the complexity of the system-on-chip Integrated Circuits to be tested is increasingly significant. Furthermore to increase competitive advantage, especially in mass production, the developed and applied test and measurement methods have to be state of the art ensuring shortest possible test times while at the same time best test coverage and robustness has to be achieved. This paper presents a novel way of addressing these challenges, by applying software engineering methods and software test techniques to the test program development process. Employing open source based software creates an integrated solution and workspace while additionally providing the necessary tool support. This leads to commercial advantages, and additionally offers a potential roadmap away from proprietary tools sets.

AB - Today’s economical cycles also challenge the test program development process for semiconductors with regard to economics, productivity, time to market and increasing quality requirements while at the same time the complexity of the system-on-chip Integrated Circuits to be tested is increasingly significant. Furthermore to increase competitive advantage, especially in mass production, the developed and applied test and measurement methods have to be state of the art ensuring shortest possible test times while at the same time best test coverage and robustness has to be achieved. This paper presents a novel way of addressing these challenges, by applying software engineering methods and software test techniques to the test program development process. Employing open source based software creates an integrated solution and workspace while additionally providing the necessary tool support. This leads to commercial advantages, and additionally offers a potential roadmap away from proprietary tools sets.

KW - Design-for-manufacture

KW - Integrated Circuits Fabrication

KW - Productivity Improvement

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KW - Test Automatisation

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Vock S, Escalona OJ, Owens FJ. Commercial Challenges and Quality Robustness Issue in Semiconductor Manufacture Test and Measurement. In Butler V, editor, Unknown Host Publication. www. 2010