Abstract
| Language | English |
|---|---|
| Pages | 42235 |
| Journal | Scientific Reports |
| Volume | 7 |
| DOIs | |
| Publication status | Published - 10 Feb 2017 |
Fingerprint
Keywords
- nitrogen doped reduced graphene oxide
- X-ray Absorption spectroscopy (XANES)
- X ray emission spectroscopy
- valence-band photoemission spectroscopy (VB-PES)
- resonant inelastic X-ray scattering (RIXS).
Cite this
}
Chemical Modification of Graphene Oxide by Nitrogenation: An X-ray Absorption and EmissionSpectroscopy Study. / Chuang, CH; Ray, SC; Mazumder, D; Sharma, S; Ganguly, A; Papakonstantinou, Pagona; Chiou, JW; Tsai, HM; Shiu, HW; Chen, CH; Lin, HJ; Guo, J; Pong, WF.
In: Scientific Reports, Vol. 7, 10.02.2017, p. 42235.Research output: Contribution to journal › Article
TY - JOUR
T1 - Chemical Modification of Graphene Oxide by Nitrogenation: An X-ray Absorption and EmissionSpectroscopy Study
AU - Chuang, CH
AU - Ray, SC
AU - Mazumder, D
AU - Sharma, S
AU - Ganguly, A
AU - Papakonstantinou, Pagona
AU - Chiou, JW
AU - Tsai, HM
AU - Shiu, HW
AU - Chen, CH
AU - Lin, HJ
AU - Guo, J
AU - Pong, WF
PY - 2017/2/10
Y1 - 2017/2/10
N2 - Nitrogen-doped graphene oxides (GO:Nx) were synthesized by a partial reduction of graphene oxide (GO) using urea [CO(NH2)2]. Their electronic/bonding structures were investigated using X-ray absorption near-edge structure (XANES), valence-band photoemission spectroscopy (VB-PES), X-ray emission spectroscopy (XES) and resonant inelastic X-ray scattering (RIXS). During GO:Nx synthesis, different nitrogen-bonding species, such as pyrrolic/graphitic-nitrogen, were formed by replacing of oxygen-containing functional groups. At lower N-content (2.7 at%), pyrrolic-N, owing to surface and subsurface diffusion of C, N and NH is deduced from various X-ray spectroscopies. In contrast, at higher N-content (5.0 at%) graphitic nitrogen was formed in which each N-atom trigonally bonds to three distinct sp2-hybridized carbons with substitution of the N-atoms for C atoms in the graphite layer. Upon nitrogen substitution, the total density of state close to Fermi level is increased to raise the valence-band maximum, as revealed by VB-PES spectra, indicating an electron donation from nitrogen, molecular bonding C/N/O coordination or/and lattice structure reorganization in GO:Nx. The well-ordered chemical environments induced by nitrogen dopant are revealed by XANES and RIXS measurements.
AB - Nitrogen-doped graphene oxides (GO:Nx) were synthesized by a partial reduction of graphene oxide (GO) using urea [CO(NH2)2]. Their electronic/bonding structures were investigated using X-ray absorption near-edge structure (XANES), valence-band photoemission spectroscopy (VB-PES), X-ray emission spectroscopy (XES) and resonant inelastic X-ray scattering (RIXS). During GO:Nx synthesis, different nitrogen-bonding species, such as pyrrolic/graphitic-nitrogen, were formed by replacing of oxygen-containing functional groups. At lower N-content (2.7 at%), pyrrolic-N, owing to surface and subsurface diffusion of C, N and NH is deduced from various X-ray spectroscopies. In contrast, at higher N-content (5.0 at%) graphitic nitrogen was formed in which each N-atom trigonally bonds to three distinct sp2-hybridized carbons with substitution of the N-atoms for C atoms in the graphite layer. Upon nitrogen substitution, the total density of state close to Fermi level is increased to raise the valence-band maximum, as revealed by VB-PES spectra, indicating an electron donation from nitrogen, molecular bonding C/N/O coordination or/and lattice structure reorganization in GO:Nx. The well-ordered chemical environments induced by nitrogen dopant are revealed by XANES and RIXS measurements.
KW - nitrogen doped reduced graphene oxide
KW - X-ray Absorption spectroscopy (XANES)
KW - X ray emission spectroscopy
KW - valence-band photoemission spectroscopy (VB-PES)
KW - resonant inelastic X-ray scattering (RIXS).
U2 - 10.1038/srep42235
DO - 10.1038/srep42235
M3 - Article
VL - 7
SP - 42235
JO - Scientific Reports
T2 - Scientific Reports
JF - Scientific Reports
SN - 2045-2322
ER -