Carbon nanostructures grown with electron and ion beam methods

    Research output: Contribution to conferencePaperpeer-review

    Abstract

    We present a comparative study where carbon nanostructures were prepared by electron and ion beam methods. The deposited thin films were analysed by Raman analysis, nanoindentation, Energy dispersive X-ray analysis (EDX) and atomic force microscopy (AFM). In most conditions, the material formed is hydrogenated amorphous carbon. This study was used to form sharp AFM supertip structures which were successfully used to image sintered ceramic samples.

    Original languageEnglish
    Pages237-240
    Number of pages4
    Publication statusPublished - 2006
    Event2006 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2006 Technical Proceedings - Boston, MA, United States
    Duration: 7 May 200611 May 2006

    Conference

    Conference2006 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2006 Technical Proceedings
    CountryUnited States
    CityBoston, MA
    Period7/05/0611/05/06

    Keywords

    • Electron beam induced deposition
    • Focused ion beam
    • Hydrogenated amorphous carbon
    • Nanoindentation
    • Raman spectroscopy

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