Carbon nanostructures grown with electron and ion beam methods

P. Lemoine; S. S. Roy; P. D. Maguire; J. A.D. McLaughlin

Carbon nanostructures grown with electron and ion beam methods

P. Lemoine, S. S. Roy, P. D. Maguire, J. A.D. McLaughlin

Research output: Contribution to conference › Paper › peer-review

Abstract

We present a comparative study where carbon nanostructures were prepared by electron and ion beam methods. The deposited thin films were analysed by Raman analysis, nanoindentation, Energy dispersive X-ray analysis (EDX) and atomic force microscopy (AFM). In most conditions, the material formed is hydrogenated amorphous carbon. This study was used to form sharp AFM supertip structures which were successfully used to image sintered ceramic samples.

Original language	English
Pages	237-240
Number of pages	4
Publication status	Published (in print/issue) - 2006
Event	2006 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2006 Technical Proceedings - Boston, MA, United States Duration: 7 May 2006 → 11 May 2006

Conference

Conference	2006 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2006 Technical Proceedings
Country/Territory	United States
City	Boston, MA
Period	7/05/06 → 11/05/06

Bibliographical note

Copyright:
Copyright 2008 Elsevier B.V., All rights reserved.

Keywords

Electron beam induced deposition
Focused ion beam
Hydrogenated amorphous carbon
Nanoindentation
Raman spectroscopy

Cite this

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title = "Carbon nanostructures grown with electron and ion beam methods",

abstract = "We present a comparative study where carbon nanostructures were prepared by electron and ion beam methods. The deposited thin films were analysed by Raman analysis, nanoindentation, Energy dispersive X-ray analysis (EDX) and atomic force microscopy (AFM). In most conditions, the material formed is hydrogenated amorphous carbon. This study was used to form sharp AFM supertip structures which were successfully used to image sintered ceramic samples.",

keywords = "Electron beam induced deposition, Focused ion beam, Hydrogenated amorphous carbon, Nanoindentation, Raman spectroscopy",

author = "P. Lemoine and Roy, {S. S.} and Maguire, {P. D.} and McLaughlin, {J. A.D.}",

note = "Copyright: Copyright 2008 Elsevier B.V., All rights reserved.; 2006 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2006 Technical Proceedings ; Conference date: 07-05-2006 Through 11-05-2006",

year = "2006",

language = "English",

pages = "237--240",

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TY - CONF

T1 - Carbon nanostructures grown with electron and ion beam methods

AU - Lemoine, P.

AU - Roy, S. S.

AU - Maguire, P. D.

AU - McLaughlin, J. A.D.

PY - 2006

Y1 - 2006

N2 - We present a comparative study where carbon nanostructures were prepared by electron and ion beam methods. The deposited thin films were analysed by Raman analysis, nanoindentation, Energy dispersive X-ray analysis (EDX) and atomic force microscopy (AFM). In most conditions, the material formed is hydrogenated amorphous carbon. This study was used to form sharp AFM supertip structures which were successfully used to image sintered ceramic samples.

AB - We present a comparative study where carbon nanostructures were prepared by electron and ion beam methods. The deposited thin films were analysed by Raman analysis, nanoindentation, Energy dispersive X-ray analysis (EDX) and atomic force microscopy (AFM). In most conditions, the material formed is hydrogenated amorphous carbon. This study was used to form sharp AFM supertip structures which were successfully used to image sintered ceramic samples.

KW - Electron beam induced deposition

KW - Focused ion beam

KW - Hydrogenated amorphous carbon

KW - Nanoindentation

KW - Raman spectroscopy

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M3 - Paper

AN - SCOPUS:33845194430

SP - 237

EP - 240

T2 - 2006 NSTI Nanotechnology Conference and Trade Show - NSTI Nanotech 2006 Technical Proceedings

Y2 - 7 May 2006 through 11 May 2006

ER -

Carbon nanostructures grown with electron and ion beam methods

Abstract

Conference

Bibliographical note

Keywords

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Cite this