Carbon nanostructures grown with electron and ion beam methods

P Lemoine, SS Roy, JP Quinn, PD Maguire, JAD McLaughlin

Research output: Contribution to journalArticle

31 Citations (Scopus)

Abstract

We present a comparative study where carbon nanostructures were prepared by electron and ion beam methods. Thin films of 10x10 mu m(2) area were prepared and analysed by Raman analysis, nanoindentation, energy dispersive X-ray analysis (EDX) and atomic force microscopy (AFM). The material formed is not soft and graphitic, but of intermediate hardness (6-13 GPa) and with Raman spectral features similar to those of hydrogenated amorphous carbon, although it contains a significant Ga content (up to 25 at.%). This study was used to form sharp AFM supertip structures which were used to image sintered ceramic samples and films of aligned carbon nanotubes. Compared to traditional Si tips, this gave an improved rendering of the sample's aspect ratio although the resolution is limited by the diameter of the C supertips.
Original languageEnglish
Pages (from-to)451-456
JournalAPPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING
Volume86
Issue number4
DOIs
Publication statusPublished - Mar 2007

Fingerprint Dive into the research topics of 'Carbon nanostructures grown with electron and ion beam methods'. Together they form a unique fingerprint.

  • Cite this