Carbon nanostructures grown with electron and ion beam methods

P Lemoine; SS Roy; JP Quinn; PD Maguire; JAD McLaughlin

doi:10.1016/j.diamond.2007.10.025

Carbon nanostructures grown with electron and ion beam methods

P Lemoine, SS Roy, JP Quinn, PD Maguire, JAD McLaughlin

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Abstract

We present a comparative study where carbon nanostructures were prepared by electron and ion beam methods. Thin films of 10x10 mu m(2) area were prepared and analysed by Raman analysis, nanoindentation, energy dispersive X-ray analysis (EDX) and atomic force microscopy (AFM). The material formed is not soft and graphitic, but of intermediate hardness (6-13 GPa) and with Raman spectral features similar to those of hydrogenated amorphous carbon, although it contains a significant Ga content (up to 25 at.%). This study was used to form sharp AFM supertip structures which were used to image sintered ceramic samples and films of aligned carbon nanotubes. Compared to traditional Si tips, this gave an improved rendering of the sample's aspect ratio although the resolution is limited by the diameter of the C supertips.

Original language	English
Pages (from-to)	451-456
Journal	APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING
Volume	86
Issue number	4
DOIs	https://doi.org/10.1016/j.diamond.2007.10.025
Publication status	Published - Mar 2007

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10.1016/j.diamond.2007.10.025

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Lemoine, P., Roy, SS., Quinn, JP., Maguire, PD., & McLaughlin, JAD. (2007). Carbon nanostructures grown with electron and ion beam methods. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 86(4), 451-456. https://doi.org/10.1016/j.diamond.2007.10.025

@article{4c712f7c688546219bcdcbfb627a5bb3,

title = "Carbon nanostructures grown with electron and ion beam methods",

abstract = "We present a comparative study where carbon nanostructures were prepared by electron and ion beam methods. Thin films of 10x10 mu m(2) area were prepared and analysed by Raman analysis, nanoindentation, energy dispersive X-ray analysis (EDX) and atomic force microscopy (AFM). The material formed is not soft and graphitic, but of intermediate hardness (6-13 GPa) and with Raman spectral features similar to those of hydrogenated amorphous carbon, although it contains a significant Ga content (up to 25 at.%). This study was used to form sharp AFM supertip structures which were used to image sintered ceramic samples and films of aligned carbon nanotubes. Compared to traditional Si tips, this gave an improved rendering of the sample's aspect ratio although the resolution is limited by the diameter of the C supertips.",

author = "P Lemoine and SS Roy and JP Quinn and PD Maguire and JAD McLaughlin",

year = "2007",

month = mar,

doi = "10.1016/j.diamond.2007.10.025",

language = "English",

volume = "86",

pages = "451--456",

journal = "Applied Physics A: Materials Science and Processing",

issn = "0947-8396",

publisher = "Springer",

number = "4",

}

TY - JOUR

T1 - Carbon nanostructures grown with electron and ion beam methods

AU - Lemoine, P

AU - Roy, SS

AU - Quinn, JP

AU - Maguire, PD

AU - McLaughlin, JAD

PY - 2007/3

Y1 - 2007/3

N2 - We present a comparative study where carbon nanostructures were prepared by electron and ion beam methods. Thin films of 10x10 mu m(2) area were prepared and analysed by Raman analysis, nanoindentation, energy dispersive X-ray analysis (EDX) and atomic force microscopy (AFM). The material formed is not soft and graphitic, but of intermediate hardness (6-13 GPa) and with Raman spectral features similar to those of hydrogenated amorphous carbon, although it contains a significant Ga content (up to 25 at.%). This study was used to form sharp AFM supertip structures which were used to image sintered ceramic samples and films of aligned carbon nanotubes. Compared to traditional Si tips, this gave an improved rendering of the sample's aspect ratio although the resolution is limited by the diameter of the C supertips.

AB - We present a comparative study where carbon nanostructures were prepared by electron and ion beam methods. Thin films of 10x10 mu m(2) area were prepared and analysed by Raman analysis, nanoindentation, energy dispersive X-ray analysis (EDX) and atomic force microscopy (AFM). The material formed is not soft and graphitic, but of intermediate hardness (6-13 GPa) and with Raman spectral features similar to those of hydrogenated amorphous carbon, although it contains a significant Ga content (up to 25 at.%). This study was used to form sharp AFM supertip structures which were used to image sintered ceramic samples and films of aligned carbon nanotubes. Compared to traditional Si tips, this gave an improved rendering of the sample's aspect ratio although the resolution is limited by the diameter of the C supertips.

U2 - 10.1016/j.diamond.2007.10.025

DO - 10.1016/j.diamond.2007.10.025

M3 - Article

VL - 86

SP - 451

EP - 456

JO - Applied Physics A: Materials Science and Processing

JF - Applied Physics A: Materials Science and Processing

SN - 0947-8396

IS - 4

ER -