Automated Industrial Load Station Inspection

Yasir Ijaz, Sonya Coleman, Dermot Kerr, N Siddique, Cormac McAteer, Khoi Nguyen

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

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Abstract

The manufacturing sector heavily relies on fast and accurate material inspection to improve product quality and productivity. Computer vision approaches based on deep learning provide superior performance for automatic material inspection over traditional methods. However, collecting a large amount of data to train a deep learning model is a challenging and expensive task, especially in an industrial environment. To address this challenge, we propose a synthetic augmentation approach, in which source data is prepared with a hybrid technique, combining synthetic data and real data to train a deep learning model, with performance evaluated on the target data. The applied approach consists of three key steps and performance evaluation indicates the ability to learn the domain-variant features and enhance the model's generalisation ability. For inspection purposes, two well-known models, YOLOv5 and YOLOv8, were employed utilizing the optimizers SGD and AdamW, respectively, which provided significant test accuracy. Building on the results, the applied approach may be recommended for similar inspection use cases in smart industry applications.
Original languageEnglish
Title of host publication 2024 IEEE International Conference on Imaging Systems and Techniques (IST)
PublisherIEEE
Number of pages6
ISBN (Electronic)979-8-3503-7821-4
ISBN (Print)979-8-3503-7822-1
DOIs
Publication statusPublished online - 28 Nov 2024
EventIEEE International Conference on Imaging Systems & Techniques (IEEE IST 2024) - WASEDA University Tokyo, Japan, Tokyo, Japan
Duration: 14 Oct 202416 Oct 2024
https://ist2024.ieee-ims.org/

Publication series

Name
ISSN (Print)2471-6162
ISSN (Electronic)2832-4234

Conference

ConferenceIEEE International Conference on Imaging Systems & Techniques (IEEE IST 2024)
Abbreviated titleIST 2024
Country/TerritoryJapan
CityTokyo
Period14/10/2416/10/24
Internet address

Bibliographical note

Publisher Copyright:
© 2024 IEEE.

Keywords

  • Computer vision
  • Synthetic Data
  • Material inspection
  • Transfer learning

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