An investigation into the electrical properties of doped barium titanate using EIS

Graham Dale; Jim McLaughlin; Micheal Conway

doi:10.1109/ISAF.2012.6297809

An investigation into the electrical properties of doped barium titanate using EIS

Graham Dale, Jim McLaughlin, Micheal Conway

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

3 Citations (Scopus)

Abstract

Barium titanate has been doped with rare earth oxides (Erbium, Holmium, Gadolinium and Yttrium) in an attempt to understand the effect on the reliability of the dielectric material for multilayer capacitor applications. The morphology of the samples used was characterized using scanning electron microscopy (SEM) with EDAX used to confirm the presence of each rare earth ions. It is suggested that incorporation of rare earth ions into the BaTiO ₃ is as a result of ionic radius, resulting in varying grain growth and electrical properties. The change in reliability and electrical properties of the capacitor can be attributed to overall distribution of rare earth oxides and their occupation site within the dielectric.

Original language	English
Title of host publication	Proc. of 2012 21st IEEE International Symposium on Applications of Ferroelectrics Held Jointly with 11th IEEE European Conference on the Applications of Polar Dielectrics and IEEE, ISAF/ECAPD/PFM 2012
DOIs	https://doi.org/10.1109/ISAF.2012.6297809
Publication status	Published - 2012
Event	2012 21st IEEE Int. Symp. on Applications of Ferroelectrics Held with 11th IEEE European Conf. on Applications of Polar Dielectrics and 4th IEEE Int. Symp on Piezoresponse Force Microscopy and Nanoscale Phenomena in Polar Materials, ISAF/ECAPD/PFM - Aveiro, Portugal Duration: 9 Jul 2012 → 13 Jul 2012

Publication series

Name	Proceedings of 2012 21st IEEE Int. Symp. on Applications of Ferroelectrics held jointly with 11th IEEE European Conference on the Applications of Polar Dielectrics and IEEE PFM, ISAF/ECAPD/PFM 2012

Conference

Conference	2012 21st IEEE Int. Symp. on Applications of Ferroelectrics Held with 11th IEEE European Conf. on Applications of Polar Dielectrics and 4th IEEE Int. Symp on Piezoresponse Force Microscopy and Nanoscale Phenomena in Polar Materials, ISAF/ECAPD/PFM
Country	Portugal
City	Aveiro
Period	9/07/12 → 13/07/12

Keywords

barium titante
ionic radius
rare earth

Access to Document

10.1109/ISAF.2012.6297809

Link to publication in Scopus

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Dale, G., McLaughlin, J., & Conway, M. (2012). An investigation into the electrical properties of doped barium titanate using EIS. In Proc. of 2012 21st IEEE International Symposium on Applications of Ferroelectrics Held Jointly with 11th IEEE European Conference on the Applications of Polar Dielectrics and IEEE, ISAF/ECAPD/PFM 2012 [6297809] (Proceedings of 2012 21st IEEE Int. Symp. on Applications of Ferroelectrics held jointly with 11th IEEE European Conference on the Applications of Polar Dielectrics and IEEE PFM, ISAF/ECAPD/PFM 2012). https://doi.org/10.1109/ISAF.2012.6297809

Dale, Graham ; McLaughlin, Jim ; Conway, Micheal. / An investigation into the electrical properties of doped barium titanate using EIS. Proc. of 2012 21st IEEE International Symposium on Applications of Ferroelectrics Held Jointly with 11th IEEE European Conference on the Applications of Polar Dielectrics and IEEE, ISAF/ECAPD/PFM 2012. 2012. (Proceedings of 2012 21st IEEE Int. Symp. on Applications of Ferroelectrics held jointly with 11th IEEE European Conference on the Applications of Polar Dielectrics and IEEE PFM, ISAF/ECAPD/PFM 2012).

@inproceedings{0c338fbb5a47485299590b8168509d4a,

title = "An investigation into the electrical properties of doped barium titanate using EIS",

abstract = "Barium titanate has been doped with rare earth oxides (Erbium, Holmium, Gadolinium and Yttrium) in an attempt to understand the effect on the reliability of the dielectric material for multilayer capacitor applications. The morphology of the samples used was characterized using scanning electron microscopy (SEM) with EDAX used to confirm the presence of each rare earth ions. It is suggested that incorporation of rare earth ions into the BaTiO 3 is as a result of ionic radius, resulting in varying grain growth and electrical properties. The change in reliability and electrical properties of the capacitor can be attributed to overall distribution of rare earth oxides and their occupation site within the dielectric.",

keywords = "barium titante, ionic radius, rare earth",

author = "Graham Dale and Jim McLaughlin and Micheal Conway",

note = "Copyright: Copyright 2012 Elsevier B.V., All rights reserved.; 2012 21st IEEE Int. Symp. on Applications of Ferroelectrics Held with 11th IEEE European Conf. on Applications of Polar Dielectrics and 4th IEEE Int. Symp on Piezoresponse Force Microscopy and Nanoscale Phenomena in Polar Materials, ISAF/ECAPD/PFM ; Conference date: 09-07-2012 Through 13-07-2012",

year = "2012",

doi = "10.1109/ISAF.2012.6297809",

language = "English",

isbn = "9781467326681",

series = "Proceedings of 2012 21st IEEE Int. Symp. on Applications of Ferroelectrics held jointly with 11th IEEE European Conference on the Applications of Polar Dielectrics and IEEE PFM, ISAF/ECAPD/PFM 2012",

booktitle = "Proc. of 2012 21st IEEE International Symposium on Applications of Ferroelectrics Held Jointly with 11th IEEE European Conference on the Applications of Polar Dielectrics and IEEE, ISAF/ECAPD/PFM 2012",

}

Dale, G, McLaughlin, J & Conway, M 2012, An investigation into the electrical properties of doped barium titanate using EIS. in Proc. of 2012 21st IEEE International Symposium on Applications of Ferroelectrics Held Jointly with 11th IEEE European Conference on the Applications of Polar Dielectrics and IEEE, ISAF/ECAPD/PFM 2012., 6297809, Proceedings of 2012 21st IEEE Int. Symp. on Applications of Ferroelectrics held jointly with 11th IEEE European Conference on the Applications of Polar Dielectrics and IEEE PFM, ISAF/ECAPD/PFM 2012, 2012 21st IEEE Int. Symp. on Applications of Ferroelectrics Held with 11th IEEE European Conf. on Applications of Polar Dielectrics and 4th IEEE Int. Symp on Piezoresponse Force Microscopy and Nanoscale Phenomena in Polar Materials, ISAF/ECAPD/PFM, Aveiro, Portugal, 9/07/12. https://doi.org/10.1109/ISAF.2012.6297809

An investigation into the electrical properties of doped barium titanate using EIS. / Dale, Graham; McLaughlin, Jim; Conway, Micheal.

Proc. of 2012 21st IEEE International Symposium on Applications of Ferroelectrics Held Jointly with 11th IEEE European Conference on the Applications of Polar Dielectrics and IEEE, ISAF/ECAPD/PFM 2012. 2012. 6297809 (Proceedings of 2012 21st IEEE Int. Symp. on Applications of Ferroelectrics held jointly with 11th IEEE European Conference on the Applications of Polar Dielectrics and IEEE PFM, ISAF/ECAPD/PFM 2012).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - An investigation into the electrical properties of doped barium titanate using EIS

AU - Dale, Graham

AU - McLaughlin, Jim

AU - Conway, Micheal

PY - 2012

Y1 - 2012

N2 - Barium titanate has been doped with rare earth oxides (Erbium, Holmium, Gadolinium and Yttrium) in an attempt to understand the effect on the reliability of the dielectric material for multilayer capacitor applications. The morphology of the samples used was characterized using scanning electron microscopy (SEM) with EDAX used to confirm the presence of each rare earth ions. It is suggested that incorporation of rare earth ions into the BaTiO 3 is as a result of ionic radius, resulting in varying grain growth and electrical properties. The change in reliability and electrical properties of the capacitor can be attributed to overall distribution of rare earth oxides and their occupation site within the dielectric.

AB - Barium titanate has been doped with rare earth oxides (Erbium, Holmium, Gadolinium and Yttrium) in an attempt to understand the effect on the reliability of the dielectric material for multilayer capacitor applications. The morphology of the samples used was characterized using scanning electron microscopy (SEM) with EDAX used to confirm the presence of each rare earth ions. It is suggested that incorporation of rare earth ions into the BaTiO 3 is as a result of ionic radius, resulting in varying grain growth and electrical properties. The change in reliability and electrical properties of the capacitor can be attributed to overall distribution of rare earth oxides and their occupation site within the dielectric.

KW - barium titante

KW - ionic radius

KW - rare earth

UR - http://www.scopus.com/inward/record.url?scp=84867919284&partnerID=8YFLogxK

U2 - 10.1109/ISAF.2012.6297809

DO - 10.1109/ISAF.2012.6297809

M3 - Conference contribution

AN - SCOPUS:84867919284

SN - 9781467326681

T3 - Proceedings of 2012 21st IEEE Int. Symp. on Applications of Ferroelectrics held jointly with 11th IEEE European Conference on the Applications of Polar Dielectrics and IEEE PFM, ISAF/ECAPD/PFM 2012

BT - Proc. of 2012 21st IEEE International Symposium on Applications of Ferroelectrics Held Jointly with 11th IEEE European Conference on the Applications of Polar Dielectrics and IEEE, ISAF/ECAPD/PFM 2012

T2 - 2012 21st IEEE Int. Symp. on Applications of Ferroelectrics Held with 11th IEEE European Conf. on Applications of Polar Dielectrics and 4th IEEE Int. Symp on Piezoresponse Force Microscopy and Nanoscale Phenomena in Polar Materials, ISAF/ECAPD/PFM

Y2 - 9 July 2012 through 13 July 2012

ER -

Dale G, McLaughlin J, Conway M. An investigation into the electrical properties of doped barium titanate using EIS. In Proc. of 2012 21st IEEE International Symposium on Applications of Ferroelectrics Held Jointly with 11th IEEE European Conference on the Applications of Polar Dielectrics and IEEE, ISAF/ECAPD/PFM 2012. 2012. 6297809. (Proceedings of 2012 21st IEEE Int. Symp. on Applications of Ferroelectrics held jointly with 11th IEEE European Conference on the Applications of Polar Dielectrics and IEEE PFM, ISAF/ECAPD/PFM 2012). https://doi.org/10.1109/ISAF.2012.6297809