TY - GEN
T1 - An investigation into the electrical properties of doped barium titanate using EIS
AU - Dale, Graham
AU - McLaughlin, Jim
AU - Conway, Micheal
N1 - Copyright:
Copyright 2012 Elsevier B.V., All rights reserved.
PY - 2012
Y1 - 2012
N2 - Barium titanate has been doped with rare earth oxides (Erbium, Holmium, Gadolinium and Yttrium) in an attempt to understand the effect on the reliability of the dielectric material for multilayer capacitor applications. The morphology of the samples used was characterized using scanning electron microscopy (SEM) with EDAX used to confirm the presence of each rare earth ions. It is suggested that incorporation of rare earth ions into the BaTiO 3 is as a result of ionic radius, resulting in varying grain growth and electrical properties. The change in reliability and electrical properties of the capacitor can be attributed to overall distribution of rare earth oxides and their occupation site within the dielectric.
AB - Barium titanate has been doped with rare earth oxides (Erbium, Holmium, Gadolinium and Yttrium) in an attempt to understand the effect on the reliability of the dielectric material for multilayer capacitor applications. The morphology of the samples used was characterized using scanning electron microscopy (SEM) with EDAX used to confirm the presence of each rare earth ions. It is suggested that incorporation of rare earth ions into the BaTiO 3 is as a result of ionic radius, resulting in varying grain growth and electrical properties. The change in reliability and electrical properties of the capacitor can be attributed to overall distribution of rare earth oxides and their occupation site within the dielectric.
KW - barium titante
KW - ionic radius
KW - rare earth
UR - http://www.scopus.com/inward/record.url?scp=84867919284&partnerID=8YFLogxK
U2 - 10.1109/ISAF.2012.6297809
DO - 10.1109/ISAF.2012.6297809
M3 - Conference contribution
AN - SCOPUS:84867919284
SN - 9781467326681
T3 - Proceedings of 2012 21st IEEE Int. Symp. on Applications of Ferroelectrics held jointly with 11th IEEE European Conference on the Applications of Polar Dielectrics and IEEE PFM, ISAF/ECAPD/PFM 2012
BT - Proc. of 2012 21st IEEE International Symposium on Applications of Ferroelectrics Held Jointly with 11th IEEE European Conference on the Applications of Polar Dielectrics and IEEE, ISAF/ECAPD/PFM 2012
T2 - 2012 21st IEEE Int. Symp. on Applications of Ferroelectrics Held with 11th IEEE European Conf. on Applications of Polar Dielectrics and 4th IEEE Int. Symp on Piezoresponse Force Microscopy and Nanoscale Phenomena in Polar Materials, ISAF/ECAPD/PFM
Y2 - 9 July 2012 through 13 July 2012
ER -