An image processing approach to measure features and identify the defects in the laser additive manufactured components

Deepika B. Patil, Akriti Nigam, Subrajeet Mohapatra

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

2 Citations (Scopus)

Abstract

The focus of this research is on the development of image processing techniques that can detect defects in the components manufactured by laser additive manufacturing. There are various factors that result in defects, and they must be identified in order to eliminate them. This paper describes (i) the manufacturing of components using different combinations of process parameters and then capturing its images, (ii) developing an image-processing technique for measuring the dimensions of the features and detecting the surface defects in additively manufactured components. The image processing technique is capable of measuring the geometric features of components with errors ranging from 1.5 % to 3.5 %. The defects identified in the manufactured components namely, void, flash and rough textures are detected and localized using morphological processing techniques. The results reveal that morphological processing techniques are accurate to identify the defects such as voids, flash formation and rough texture in components manufactured by the laser additive manufacturing process.

Original languageEnglish
Title of host publication4th International Conference on Recent Trends in Computer Science and Technology, ICRTCST 2021 - Proceedings
EditorsDeobrata Kumar, Tapan Kumar Dey, Smita Dash
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages62-66
Number of pages5
ISBN (Electronic)9781665466332
DOIs
Publication statusPublished (in print/issue) - 27 May 2022
Event4th International Conference on Recent Trends in Computer Science and Technology, ICRTCST 2021 - Jamshedpur, Jharkhand, India
Duration: 11 Feb 202212 Feb 2022

Publication series

Name4th International Conference on Recent Trends in Computer Science and Technology, ICRTCST 2021 - Proceedings

Conference

Conference4th International Conference on Recent Trends in Computer Science and Technology, ICRTCST 2021
Country/TerritoryIndia
CityJamshedpur, Jharkhand
Period11/02/2212/02/22

Bibliographical note

Publisher Copyright:
© 2022 IEEE.

Keywords

  • Additive manufacturing
  • Defect detection
  • Feature measurement
  • Image processing
  • Laser deposition

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