| Original language | English |
|---|---|
| Publication status | Unpublished - Jun 2025 |
| Event | DTNet+ Special Interest Group (SIG) Conference: Swansea University - Swansea, United Kingdom Duration: 16 Jun 2025 → 17 Jun 2025 |
Conference
| Conference | DTNet+ Special Interest Group (SIG) Conference: Swansea University |
|---|---|
| Country/Territory | United Kingdom |
| City | Swansea |
| Period | 16/06/25 → 17/06/25 |
Funding
This research is funded by Innovate UK Knowledge Transfer Network and Invest Northern Ireland [Project Number: 10078007].
UN SDGs
This output contributes to the following UN Sustainable Development Goals (SDGs)
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SDG 9 Industry, Innovation, and Infrastructure
Keywords
- Surface mount technology (SMT)
- Digital twin
- Tolerance optimisation
- Automated optical inspection
- Real-time data analytics
Activities
- 1 Invited talk
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Digital Twins, Fault Diagnosis, and Simulation Testbeds: From Automotive Engines to Advanced Manufacturing
Ng, M. (Speaker)
23 Apr 2026 → 24 Apr 2026Activity: Talk or presentation › Invited talk
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Design and Development of a Robust Tolerance Optimisation Framework for Automated Optical Inspection in Semiconductor Manufacturing
Kogileru, S., McBride, M., Bi, Y. & Ng, K. Y., 6 Jan 2026, (Published online) 2025 IEEE 23rd International Conference on Industrial Informatics (INDIN). IEEE, p. 1-4 4 p. (2025 IEEE 23rd International Conference on Industrial Informatics (INDIN)).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review
Open AccessFile3 Downloads (Pure) -
Artificial Intelligence in Smart Manufacturing: Emerging Opportunities and Prospects
Islam, M. M. M., Emon, J. I., Ng, K. Y., Asadpour, A., Aziz, M. M. R. A., Baptista, M. L. & Kim, J. M., 6 Mar 2025, Springer Series in Advanced Manufacturing. Springer Nature, p. 9-36 28 p. (Springer Series in Advanced Manufacturing; vol. Part F138).Research output: Chapter in Book/Report/Conference proceeding › Chapter › peer-review
8 Link opens in a new tab Citations (Scopus) -
Design and Development of a Robust Tolerance Optimisation Framework for Automated Optical Inspection in Semiconductor Manufacturing
Kogileru, S., McBride, M., Bi, Y. & Ng, K. Y., 6 May 2025, (Published online) 4 p.Research output: Working paper › Preprint
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