A robust method for the recognition of palmprints

O Nibouche, H. Wang, Sriram Varadarajan, Bryan Scotney

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Palmprint recognition has received in the last 20 years a great deal of the research community's attention. In this paper a new palmprint matching approach based on corner feature point extraction is proposed. A 72-element fixed-length descriptor is used to capture distinctive information of each feature point neighborhood and to build a measure of similarity whilst their coordinates provide a measure of proximity between the points. Matching two images takes into account both similarity and proximity measures which converts into a cost minimization problem. Our experiments carried out on a database of 250 prints from the Poly U database have yielded very good results evidenced by an EER of 0.31%.
Original languageEnglish
Title of host publication14th IEEE International Conference on Advanced Video and Signal Based Surveillance, AVSS 2017
ISBN (Electronic)978-1-5386-2939-0
Publication statusPublished - 29 Aug 2017
Event14th IEEE International Conference on Advanced Video and Signal Based Surveillance (AVSS) - Lecce, Italy
Duration: 29 Aug 20171 Sep 2017
https://ieeexplore.ieee.org/xpl/conhome/8055736/proceeding

Conference

Conference14th IEEE International Conference on Advanced Video and Signal Based Surveillance (AVSS)
CityItaly
Period29/08/171/09/17
Internet address

Keywords

  • Feature extraction
  • Robustness
  • Databases
  • Coordinate measuring machines
  • Image resolution
  • Transforms
  • Eigenvalues and eigenfunctions

Fingerprint Dive into the research topics of 'A robust method for the recognition of palmprints'. Together they form a unique fingerprint.

  • Cite this

    Nibouche, O., Wang, H., Varadarajan, S., & Scotney, B. (2017). A robust method for the recognition of palmprints. In 14th IEEE International Conference on Advanced Video and Signal Based Surveillance, AVSS 2017 https://ieeexplore.ieee.org/document/8078487