A method to study the dispersion and orientation of nanoclay tactoids in PET matrix-focused ion beam milling combined with electron microscopy

R. S. Rajeev; E. Harkin-Jones; K. Soon; T. McNally; G. Menary; C. G. Armstrong; P. J. Martin

doi:10.1016/j.matlet.2008.06.012

A method to study the dispersion and orientation of nanoclay tactoids in PET matrix-focused ion beam milling combined with electron microscopy

R. S. Rajeev
, E. Harkin-Jones
, K. Soon
, T. McNally
, G. Menary
, C. G. Armstrong
, P. J. Martin

Queens University Belfast

Research output: Contribution to journal › Article › peer-review

13 Citations (Scopus)

Abstract

This paper describes a method to evaluate the dispersion and orientation of nanotactoids in polymer matrix The method involves focused ion beam (FIB) milling of the sample followed by observation of the milled surface under SEM. Compared to conventional TEM techniques, a wider area of the sample can be observed by this method which will give a better representation of the dispersion and orientation of the nanotactoids in the matrix. Both the surface and the cross-section of the sample can be analyzed by this method. However, the FIB milling and imaging conditions need to be optimized to minimize the sample damage.

Original language	English
Pages (from-to)	4118-4120
Number of pages	3
Journal	Materials Letters
Volume	62
Issue number	25
DOIs	https://doi.org/10.1016/j.matlet.2008.06.012
Publication status	Published (in print/issue) - 30 Sept 2008

Funding

We wish to acknowledge the support of the UK Engineering and Physical Sciences Research Council who funded this work via grant number EP/C006992/1. Thanks are also due to Dr. C. Jiao of FEI Company, The Netherlands and Mr. Stephen McFarland of Queen's University, Belfast, for helping with some of the FIB studies.

Keywords

Ion beam technology
Nanocomposites
SEM

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10.1016/j.matlet.2008.06.012

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abstract = "This paper describes a method to evaluate the dispersion and orientation of nanotactoids in polymer matrix The method involves focused ion beam (FIB) milling of the sample followed by observation of the milled surface under SEM. Compared to conventional TEM techniques, a wider area of the sample can be observed by this method which will give a better representation of the dispersion and orientation of the nanotactoids in the matrix. Both the surface and the cross-section of the sample can be analyzed by this method. However, the FIB milling and imaging conditions need to be optimized to minimize the sample damage.",

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AU - Soon, K.

AU - McNally, T.

AU - Menary, G.

AU - Armstrong, C. G.

AU - Martin, P. J.

PY - 2008/9/30

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AB - This paper describes a method to evaluate the dispersion and orientation of nanotactoids in polymer matrix The method involves focused ion beam (FIB) milling of the sample followed by observation of the milled surface under SEM. Compared to conventional TEM techniques, a wider area of the sample can be observed by this method which will give a better representation of the dispersion and orientation of the nanotactoids in the matrix. Both the surface and the cross-section of the sample can be analyzed by this method. However, the FIB milling and imaging conditions need to be optimized to minimize the sample damage.

KW - Ion beam technology

KW - Nanocomposites

KW - SEM

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JO - Materials Letters

JF - Materials Letters

IS - 25

ER -

A method to study the dispersion and orientation of nanoclay tactoids in PET matrix-focused ion beam milling combined with electron microscopy

Abstract

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Keywords

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