A method to study the dispersion and orientation of nanoclay tactoids in PET matrix-focused ion beam milling combined with electron microscopy

R. S. Rajeev; E. Harkin-Jones; K. Soon; T. McNally; G. Menary; C. G. Armstrong; P. J. Martin

doi:10.1016/j.matlet.2008.06.012

A method to study the dispersion and orientation of nanoclay tactoids in PET matrix-focused ion beam milling combined with electron microscopy

R. S. Rajeev, E. Harkin-Jones, K. Soon, T. McNally, G. Menary, C. G. Armstrong, P. J. Martin

Research output: Contribution to journal › Article › peer-review

12 Citations (Scopus)

Abstract

This paper describes a method to evaluate the dispersion and orientation of nanotactoids in polymer matrix The method involves focused ion beam (FIB) milling of the sample followed by observation of the milled surface under SEM. Compared to conventional TEM techniques, a wider area of the sample can be observed by this method which will give a better representation of the dispersion and orientation of the nanotactoids in the matrix. Both the surface and the cross-section of the sample can be analyzed by this method. However, the FIB milling and imaging conditions need to be optimized to minimize the sample damage.

Original language	English
Pages (from-to)	4118-4120
Number of pages	3
Journal	Materials Letters
Volume	62
Issue number	25
DOIs	https://doi.org/10.1016/j.matlet.2008.06.012
Publication status	Published (in print/issue) - 30 Sept 2008

Keywords

Ion beam technology
Nanocomposites
SEM

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10.1016/j.matlet.2008.06.012

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abstract = "This paper describes a method to evaluate the dispersion and orientation of nanotactoids in polymer matrix The method involves focused ion beam (FIB) milling of the sample followed by observation of the milled surface under SEM. Compared to conventional TEM techniques, a wider area of the sample can be observed by this method which will give a better representation of the dispersion and orientation of the nanotactoids in the matrix. Both the surface and the cross-section of the sample can be analyzed by this method. However, the FIB milling and imaging conditions need to be optimized to minimize the sample damage.",

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AU - Rajeev, R. S.

AU - Harkin-Jones, E.

AU - Soon, K.

AU - McNally, T.

AU - Menary, G.

AU - Armstrong, C. G.

AU - Martin, P. J.

PY - 2008/9/30

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N2 - This paper describes a method to evaluate the dispersion and orientation of nanotactoids in polymer matrix The method involves focused ion beam (FIB) milling of the sample followed by observation of the milled surface under SEM. Compared to conventional TEM techniques, a wider area of the sample can be observed by this method which will give a better representation of the dispersion and orientation of the nanotactoids in the matrix. Both the surface and the cross-section of the sample can be analyzed by this method. However, the FIB milling and imaging conditions need to be optimized to minimize the sample damage.

AB - This paper describes a method to evaluate the dispersion and orientation of nanotactoids in polymer matrix The method involves focused ion beam (FIB) milling of the sample followed by observation of the milled surface under SEM. Compared to conventional TEM techniques, a wider area of the sample can be observed by this method which will give a better representation of the dispersion and orientation of the nanotactoids in the matrix. Both the surface and the cross-section of the sample can be analyzed by this method. However, the FIB milling and imaging conditions need to be optimized to minimize the sample damage.

KW - Ion beam technology

KW - Nanocomposites

KW - SEM

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SP - 4118

EP - 4120

JO - Materials Letters

JF - Materials Letters

IS - 25

ER -

A method to study the dispersion and orientation of nanoclay tactoids in PET matrix-focused ion beam milling combined with electron microscopy

Abstract

Keywords

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