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Terence Sweeney, (PhD Researcher)

  • 0 Citations
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20192019
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  • 1 Similar Profiles
Learning systems Engineering & Materials Science
Inspection Engineering & Materials Science
Defects Engineering & Materials Science
Crystal defects Engineering & Materials Science
Quality control Engineering & Materials Science
Semiconductor materials Engineering & Materials Science
Industry Engineering & Materials Science

Research Output 2019 2019

  • 1 Conference contribution

A Machine Learning Approach to Wafer Defect Classification using Bag of Visual Words

Sweeney, T., Coleman, S. & Kerr, D., 28 Aug 2019, Irish Machine Vision and Image Processing Conference. p. 183 - 189 7 p.

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Open Access
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Learning systems
Inspection
Defects
Crystal defects
Quality control